參數(shù)資料
型號(hào): GE28F640W30TD70
廠商: INTEL CORP
元件分類: PROM
英文描述: 4M X 16 FLASH 1.8V PROM, 70 ns, PBGA56
封裝: 0.75 MM PITCH, VFBGA-56
文件頁(yè)數(shù): 48/104頁(yè)
文件大小: 1443K
代理商: GE28F640W30TD70
28F640W30, 28F320W30, 28F128W30
June 2005
Intel Wireless Flash Memory (W30)
Datasheet
48
Order Number: 290702, Revision: 011
8.7
AC I/O Test Conditions
Note:
Input timing begins, and output timing ends, at VCCQ/2. Input rise and fall times (10% to 90%) < 5 ns.
Worst case speed conditions are when VCC = VCCMin.
Note:
See Table 16 for component values.
Figure 22.
AC Input/Output Reference Waveform
V
CCQ
0V
V
CCQ/2
V
CCQ/2
Test Points
Input
Output
Figure 23.
Transient Equivalent Testing Load Circuit
Device
Under Test
V
CCQ
C
L
R
2
R
1
Out
Table 16.
Test Configuration Component Values for Worst Case Speed Conditions
Test Configuration
CL (pF)
R1 (k)R1 (k)
VCCQMin Standard Test
30
25
Note:
CL includes jig capacitance.
Figure 24.
Clock Input AC Waveform
CLK [C]
V
IH
V
IL
R203
R202
R201
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