參數(shù)資料
型號: GE28F640W30TD70
廠商: INTEL CORP
元件分類: PROM
英文描述: 4M X 16 FLASH 1.8V PROM, 70 ns, PBGA56
封裝: 0.75 MM PITCH, VFBGA-56
文件頁數(shù): 29/104頁
文件大?。?/td> 1443K
代理商: GE28F640W30TD70
28F640W30, 28F320W30, 28F128W30
June 2005
Intel Wireless Flash Memory (W30)
Datasheet
30
Order Number: 290702, Revision: 011
7.2
Read Operations - 180 nm Lithography
Synchronous Specifications
R301
tAVCH
Address Valid Setup to CLK
9
-
9
-
10
-
ns
-
R302
tVLCH
ADV# Low Setup to CLK
10
-
10
-
10
-
ns
-
R303
tELCH
CE# Low Setup to CLK
9
-
9
-
9
-
ns
-
R304
tCHQV
CLK to Output Valid
-
20
-
22
-
20
ns
-
R305
tCHQX
Output Hold from CLK
5
-
5
-
5
-
ns
-
R306
tCHAX
Address Hold from CLK
10
-
10
-
10
-
ns
2
R307
tCHTV
CLK to WAIT Valid
-
20
-
22
-
22
ns
-
Notes:
1.
allowable input slew rate.
2.
Address hold in synchronous-burst mode is defined as tCHAX or tVHAX, whichever timing specification is
satisfied first.
3.
OE# can be delayed by up to tELQV – tGLQV after the falling edge of CE# without impact to tELQV.
4.
Sampled, not 100% tested.
5.
Applies only to subsequent synchronous reads.
6.
During the initial access of a synchronous burst read, data from the first word might begin to be driven onto the
data bus as early as the first clock edge after tAVQV.
Table 12.
Read Operations - 180 nm Lithography (Sheet 1 of 2)
#
Sym
Parameter
1
32-Mbit
64-Mbit
128-Mbit
Units
Notes
-70
-85
-90
Min
Max
Min
Max
Min
Max
Asynchronous Specifications
R1
tAVAV
Read Cycle Time
70
-
85
-
90
-
ns
6
R2
tAVQV
Address to Output Valid
-
70
-
-90
ns
6
R3
tELQV
CE# Low to Output Valid
-
70
-
-90
ns
6
R4
tGLQV
OE# Low to Output Valid
-
30
-
30
-
30
ns
3
R5
tPHQV
RST# High to Output Valid
-
150
-
150
-
150
ns
-
R6
tELQX
CE# Low to Output Low-Z
0
-
0
-
0
-
ns
4
R7
tGLQX
OE# Low to Output Low-Z
0
-
0
-
0
-
ns
3,4
R8
tEHQZ
CE# High to Output High-Z
-
20
-
20
-
20
ns
4
R9
tGHQZ
OE# High to Output High-Z
-
14
-
14
ns
3,4
Table 11.
Read Operations - 130 nm Lithography (Sheet 2 of 2)
#
Sym
Parameter
1
32-Mbit
64-Mbit
128-Mbit
Units
Notes
-70
-85
-70
Min
Max
Min
Max
Min
Max
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