參數(shù)資料
型號: DS3105LN+
廠商: Maxim Integrated Products
文件頁數(shù): 11/124頁
文件大?。?/td> 0K
描述: IC TIMING LINE CARD 64-LQFP
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標(biāo)準(zhǔn)包裝: 160
類型: 定時(shí)卡 IC,多路復(fù)用器
PLL:
主要目的: 以太網(wǎng),SONET/SDH,Stratum,電信
輸入: CMOS,LVDS,LVPECL,TTL
輸出: CMOS,LVDS,LVPECL,TTL
電路數(shù): 1
比率 - 輸入:輸出: 5:2
差分 - 輸入:輸出: 無/是
頻率 - 最大: 312.5MHz
電源電壓: 1.62 V ~ 1.98 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 64-LQFP
供應(yīng)商設(shè)備封裝: 64-LQFP(10x10)
包裝: 托盤
DS3105
108
9.4
JTAG Test Registers
IEEE 1149.1 requires a minimum of two test registers—the bypass register and the boundary scan register. An
optional test register, the identification register, has been included in the device design. It is used with the IDCODE
instruction and the Test-Logic-Reset state of the TAP controller.
Bypass Register. This is a single 1-bit shift register used with the BYPASS, CLAMP, and HIGHZ instructions to
provide a short path between JTDI and JTDO.
Boundary Scan Register. This register contains a shift register path and a latched parallel output for control cells
and digital I/O cells. The BSDL file is available on the DS3105 page of Microsemi’s website.
Identification Register. This register contains a 32-bit shift register and a 32-bit latched parallel output. It is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state. The device
identification code for the DS3105 is shown in Table 9-2.
Table 9-2. JTAG ID Code
DEVICE
REVISION
DEVICE CODE
MANUFACTURER CODE
REQUIRED
DS3105
Consult factory
0000000010100011
00010100001
1
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