參數(shù)資料
型號: DS2196LN
廠商: DALLAS SEMICONDUCTOR
元件分類: Digital Transmission Controller
英文描述: DATACOM, FRAMER, PQFP100
封裝: LQFP-100
文件頁數(shù): 32/160頁
文件大?。?/td> 559K
代理商: DS2196LN
DS2196
127 of 160
20
JTAG-BOUNDARY SCAN ARCHITECTURE AND TEST ACCESS PORT
20.1 DESCRIPTION
The DS2196 IEEE 1149.1 design supports the standard instruction codes SAMPLE/PRELOAD,
BYPASS, and EXTEST. Optional public instructions included with this design are HIGHZ, CLAMP,
and IDCODE. See Figure 20-1 for a block diagram. The DS2196 contains the following items, which
meet the requirements, set by the IEEE 1149.1 Standard Test Access Port and Boundary Scan
Architecture.
Test Access Port (TAP)
TAP Controller
Instruction Register
Bypass Register
Boundary Scan Register
Device Identification Register
Details on Boundary Scan Architecture and the Test Access Port can be found in IEEE 1149.1-1990,
IEEE 1149.1a-1993, and IEEE 1149.1b-1994.
The Test Access Port has the necessary interface pins; JTRST, JTCLK, JTMS, JTDI, and JTDO. See the
pin descriptions for details.
Figure 20-1: BOUNDARY SCAN ARCHITECTURE
+V
Boundary Scan
Register
Identification
Register
Bypass
Register
Instruction
Register
JTDI
JTMS
JTCLK
JTRST
JTDO
+V
Test Access Port
Controller
MUX
10K
Select
Output Enable
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