參數(shù)資料
型號: WEDPNF8M721V-1012BC
元件分類: 存儲(chǔ)器
英文描述: SPECIALTY MEMORY CIRCUIT, PBGA275
封裝: 32 X 25 MM, PLASTIC, BGA-275
文件頁數(shù): 9/42頁
文件大?。?/td> 686K
代理商: WEDPNF8M721V-1012BC
17
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
WEDPNF8M721V-XBX
STANDBY MODE
When the system is not reading or writing to the device, it can
place the device in standby mode. In this mode, current consump-
tion is greatly reduced, and the outputs are placed in the high
impedance state, independent of the FOE input.
The device enters the CMOS standby mode when the FCS and RST
pins are both held at Vcc
±0.3V. (Note that this is a more restricted
voltage range than VIH.) If FCS and RST are held at VIH, but not
within Vcc to
±0.3V the device will be in the standby mode, but the
standby current will be greater. The device requires standard
access time (tCE) for read access when the device is in either of
these standby modes, before it is ready to read data.
If the device is deselected during erasure or programming, the
device draws active current until the operation is completed.
In the Flash DC Characteristics table, IFCC3 and IFCC4 represent the
standby current specifications.
AUTOMATIC SLEEP MODE
The automatic sleep mode minimizes Flash device energy
consumption. The device automatically enables this mode when
addresses remain stable for t ACC + 30 ns. The automatic sleep
mode is independent of the FCS, FWE, and FOE control signals.
Standard address access timings provide new data when addresses
are changed. While in sleep mode, output data is latched and
always available to the system. IFcc5 in the DC Characteristics
table represents the automatic sleep mode current specification.
RST: HARDWARE RESET PIN
The RST pin provides a hardware method of resetting the device
to reading array data. When the RST pin is driven low for at least
a period of tRP or greater the device immediately terminates any
operation in progress, tristates all output pins, and ignores all
read/write commands for the duration of the RST pulse. The
device also resets the internal state machine to reading array
data. The operation that was interrupted should be reinitiated
once the device is ready to accept another command sequence, to
ensure data integrity.
Current is reduced for the duration of the RST pulse. When RST is
held at Vss
±0.3V, the device draws CMOS standby current (IFCC4).
If RST is held at VIL but not within Vss
±0.3V, the standby current
will be greater.
The RST pin may be tied to the system reset circuitry. A system
reset would thus also reset the Flash memory, enabling the
system to read the boot-up firmware from the Flash memory.
If RST is asserted during a program or erase operation, RY/BY1 pin
remains “0” (busy) until the internal reset operation is complete,
which requires a time of tREADY (during Embedded Algorithms).
The system can thus monitor RY/BY1 to determine whether the
reset operation is complete. If RST is asserted when a program or
erase operation is not executing (RY/BY1 pin is “1”), the reset
operation is completed within a time of tREADY (not during Embed-
ded Algorithms). The system can read data tRH after the RST pin
returns to VIH.
Refer to the Flash AC Characteristics and hardware reset tables
for RST parameters and to Figure 19 for the timing diagram.
TABLE 5 - BOTTOM BOOT BLOCK SECTOR ADDRESS TABLE
Sector Size
(x8) Address Range
Sector
A18
A17
A16
A15
A14
A13
A12
(Kbytes)
(In hexidecimal)
SA0
0
X
16
00000h-03FFFh
SA1
0
1
0
8
04000h-05FFFh
SA2
0
1
8
06000h-07FFFh
SA3
0
1
X
32
08000h-0FFFFh
SA4
0
1
X
64
10000h-1FFFFh
SA5
0
1
0
X
64
20000h-2FFFFh
SA6
0
1
X
64
30000h-3FFFFh
SA7
0
1
0
X
64
40000h-4FFFFh
SA8
0
1
0
1
X
64
50000h-5FFFFh
SA9
0
1
0
X
64
60000h-6FFFFh
SA10
0
1
X
64
70000h-7FFFFh
SA11
1
0
X
64
80000h-8FFFFh
SA12
1
0
1
X
64
90000h-9FFFFh
SA13
1
0
1
0
X
64
A0000h-AFFFFh
SA14
1
0
1
X
64
B0000h-BFFFFh
SA15
1
0
X
64
C0000h-CFFFFh
SA16
1
0
1
X
64
D0000h-DFFFFh
SA17
1
0
X
64
E0000h-EFFFFh
SA18
1
X
64
F0000h-FFFFFh
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