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White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
WEDPNF8M721V-XBX
REQUIREMENTS FOR READING ARRAY DATA
To read array data from the outputs, the system must drive the FCS
and FOE pins to VIL. FCS is the power control and selects the
device. FOE is the output control and gates array data to the output
pins. FWE should remain at VIH. The BYTE1 pin determines whether
the device outputs array data in words or bytes.
The internal state machine is set for reading array data upon
device power-up, or after a hardware reset. This ensures that no
spurious alteration of the memory content occurs during the
power transition. No command is necessary in this mode to obtain
array data. Standard microprocessor read cycles that assert valid
addresses on the device data outputs. The device remains en-
abled for read access until the command register contents are
altered.
See “Reading Array Data” for more information. Refer to the Flash
AC Read-only Operations table for timing specifications and to
Figure 11 for the timing diagram. IFCC1 in the ICC Specifications and
Conditions table represents the active current specification for
reading array data.
WRITE COMMANDS/COMMAND SEQUENCES
To writes a command or command sequence (which includes
programming data to the device and erasing sectors of memory),
the system must drive FWE and FCS to VIL, and FOE to VIH.
For program operations, the BYTE1 pin determines whether the
device accepts program data in bytes or words. Refer to “Word/
Byte Configuration” for more information.
The device features an Unlock Bypass mode to facilitate faster
programming. Once the device enters the Unlock Bypass mode,
only two write cycles are required to program a byte, instead of four.
An erase operation can erase one sector, multiple sectors, or the
entire device. Table 5 indicates the address space that each
sector occupies. A “sector address” consists of the address bits
required to uniquely select a sector. The “Flash Command Defini-
tions” section has details on erasing a sector or the entire chip, or
suspending/resuming the erase operation.
After the system writes the autoselect command sequence, the
device enters the autoselect mode. The system can then read
autoselect codes from the internal register (which is separate
from the memory array) on FD7-0. Standard read cycle timings
apply in this mode. Refer to the "Autoselect Mode" and "Autoselect
Command Sequence" sections for more information.
IFCC2 in the DC Characteristics table represents the active current
specifications for the write mode. The “Flash AC Characteristics”
section contains timing specification tables and timing diagrams
for write operations.
PROGRAM AND ERASE OPERATION STATUS
During an erase or program operation, the system may check the
status of the operation by reading the status bits on FD7-0.
Standard read cycle timings and IFCC read specifications apply.
Refer to “Write Operation Status” for more information, and to
“Flash AC Characteristics” for timing diagrams.
TABLE 4 - DEVICE BUS OPERATIONS
LEGEND:
L
= Logic Low = VIL
X
= Don’t Care
FDOUT = Flash Data Out
H
= Logic High = VIH
FAIN
= Flash Address In
VID = 12.0
± 0.5V
FDIN
= Flash Data In
NOTES:
1. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the "Sector Protection/Unprotection" section.
2. Addresses are FA18: FA0 in word mode (BYTE1 = VIH), FA18: FA-1 in byte mode (BYTE1 = VIL)
FD8-15
Operation
FCS
FOE
FWE
RST
Addresses (2)
FD0-7
BYTE1
= VIH
=VIL
Read
L
H
FAIN
FDOUT
FD8-14 = High Z
Write
L
H
L
H
FAIN
FDOUT
FD15 = FA-1
Standby
Vcc
±0.3V
X
Vcc
± 0.3V
X
High Z
Output Disable
L
H
X
High Z
Reset
X
L
X
High Z
Sector Address,
Sector Protect (1)
L
H
L
VID
FA6 = L, FA1 = H,
FDIN
XX
FA0 = L
Sector Address,
Sector Unprotect (1)
L
H
L
VID
FA6 = H, FA1 = H,
FDIN
XX
FA0 = L
Temporary Sector Unprotect
X
VID
AIN
FDIN
High Z