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Introduction
1.1 Library Description
Samsung ASIC
1-1
STDM110
1.1
Library
Description
Samsung ASIC offers STDM110 as 0.25um CMOS standard cell library.
Samsung's 0.25um cell-based logic process providing up to 5 layers of
interconnect metal with various I/O pad-pitch options such as 70um pitch pad and
80um pitch pad.
STDM110 which reduced power dissipation and system cost by merging the logic
and IPs as a whole and connecting internally from logic to memory data bus is
ideal for high-performance products such as graphics controller, projector,
portable CD and so on.
STDM110 can support up to eight million gate counts of logic providing 75% of
usable gate. Logic density is 2.1 times greater than that of MDL90. The power
consumption of compiled memory is 90% smaller than MDL90.
STDM110 also supports fully user-configurable compiled memory and datapath
elements. Each element is provided as a compiler. Two different types of
compiled memories in STDM110 are available to support memories suitable to
high-density and low-power applications.
To support mixed voltage environments, 2.5V, 3.3V drive and 5V-tolerant IO cells
are available. LVTTL, LVCMOS, PCI, OSC, AGP, PECL, HSTL, LVDS and USB
buffers are supported. To better support a system-on-chip design style, various
core cells are available including processor cores like ARM7TDMI/ARM9TDMI/
ARM920T/ARM940T from ARM, Teaklite from DSPG.
The STDM110 supports data transmission and communication core such as
USB, IEEE1284 and UART.
The list of analog core cells includes ADC, DAC, CODEC, LVDS, RAMDAC and
PLL with various bits and frequency ranges.
Samsungdesign methodology offers an comprehensivetiming driven design flow
including automated time budgeting, tight floorplan synthesis intergration,
powerful timing analysis and timing driven layout. Its advanced characterization
flow provides accurate timing data and robust delay models for a 0.25um very
deep-submicron technology. Advanced verification methods like static timing
analysis and formal verification provide an effective verification methodology with
a variety of simulators and cycle based simulation. Samsung DFT methodology
supports scan design, BIST and JTAG boundary scan. Samsung provides a full
set of test-ready IPs with an efficient core test integration methodology.