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參數(shù)資料
| 型號： | SCANPSC110FSC |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| 中文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, PDSO28 |
| 封裝： | 0.300 INCH, MS-013, SOIC-28 |
| 文件頁數(shù)： | 3/25頁 |
| 文件大?。?/td> | 283K |
| 代理商： | SCANPSC110FSC |
3
www.fairchildsemi.com
S
TABLE 2. Detailed Pin Description Table
Note 1:
All pins are active HIGH unless otherwise noted.
Name
I/O (Note 1)
Pin #
Description
(SOIC & LCC)
10
TMS
B
TTL Input w/Pull-Up Resistor
BACKPLANE TEST MODE SELECT:
Controls sequencing
through the TAP Controller of the SCANPSC110F Bridge. Also
controls sequencing of the TAPs which are on the three (3) local
scan chains.
BACKPLANE TEST DATA INPUT:
All backplane scan data is
supplied to the SCANPSC110F through this input pin.
BACKPLANE TEST DATA OUTPUT:
This output drives test data
from the SCANPSC110F and the local TAPs, back toward the scan
master controller.
TDI
B
TTL Input w/Pull-Up Resistor
12
TDO
B
3-STATEable,
32 mA/64 mA Drive,
Reduced-Swing,
Output
TTL Schmitt Trigger Input
13
TCK
B
11
TEST CLOCK INPUT FROM THE BACKPLANE:
This is the mas-
ter clock signal that controls all scan operations of the
SCANPSC110F and of the three (3) local scan ports.
TRST
TTL Input w/Pull-Up Resistor
9
TEST RESET:
An asynchronous reset signal (active LOW) which
initializes the SCANPSC110F logic.
SLOT IDENTIFICATION:
The configuration of these six (6) pins is
used to identify (assign a unique address to) each SCANPSC110F
on the system backplane.
S
(0
–
5)
TTL Inputs
2, 3, 4,
5, 6, 7
OE
TTL Input
1
OUTPUT ENABLE for the Local Scan Ports, active LOW.
When
HIGH, this active-LOW control signal 3-STATEs all three local scan
ports on the SCANPSC110F, to enable an alternate resource to
access one or more of the three (3) local scan chains.
TEST DATA OUTPUTS:
Individual output for each of the three (3)
local scan ports.
TDO
L(1
–
3)
3-STATEable,
24 mA/24 mA
Drive Outputs
TDI
L(1
–
3)
TTL Inputs w/Pull-Up
Resistors
TMS
L(1
–
3)
3-STATEable,
24 mA/24 mA
Drive Outputs
15,19,
24
18, 23,
27
16, 20,
25
TEST DATA INPUTS:
Individual scan data input for each of the
three (3) local scan ports.
TEST MODE SELECT OUTPUTS:
Individual output for each of the
three (3) local scan ports. TMS
does
not
provide a pull-up resistor
(which is assumed to be present on a connected TMS input, per
the IEEE 1149.1 requirement)
LOCAL TEST CLOCK OUTPUTS:
Individual output for each of
the three (3) local scan ports. These are buffered versions of
TCK
B
.
TCK
L(1
–
3)
3-STATEable,
24 mA/24 mA
Drive Output
V
CC
Power Supply Voltage
GND
Ground potential
17, 22,
26
8, 28
14, 21
Power supply pins, 5.0V
±
10%.
Power supply pins 0V.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SCANPSC110FSCX | 功能描述:特定功能邏輯 SCAN JTAG Port RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SCANSTA101 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Low Voltage IEEE 1149.1 STA Master |
| SCANSTA101_06 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Low Voltage IEEE 1149.1 STA Master |
| SCANSTA101SM | 功能描述:接口 - 專用 RoHS:否 制造商:Texas Instruments 產(chǎn)品類型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:BGA-59 |
| SCANSTA101SM/NOPB | 功能描述:接口 - 專用 Low Vltg IEEE 1149.1 Sys Test Access RoHS:否 制造商:Texas Instruments 產(chǎn)品類型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:BGA-59 |
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