參數(shù)資料
型號: SCANPSC110FSC
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: 微控制器/微處理器
英文描述: SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
中文描述: SPECIALTY MICROPROCESSOR CIRCUIT, PDSO28
封裝: 0.300 INCH, MS-013, SOIC-28
文件頁數(shù): 2/25頁
文件大?。?/td> 283K
代理商: SCANPSC110FSC
www.fairchildsemi.com
2
S
TABLE 1. Glossary of Terms
LFSR
Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial test
data.
Local Scan Port. A four signal port that drives a
local
(i.e. non-backplane) scan chain.
(e.g., TCK
L1
, TMS
L1
, TDO
L1
, TDI
L1
)
Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANPSC110F Bridge Test
Access Port that drives them. The term
local
was adopted from the system test architecture that the
SCANPSC110F Bridge will most commonly be used in; namely, a system test backplane with a
SCANPSC110F Bridge on each card driving up to 3
local
scan rings per card. (Each card can contain
multiple SCANPSC110Fs, with 3 local scan ports per SCANPSC110F.)
Park, parked, unpark, and unparked, are used to describe the state of the LSP controller and the state
of the local TAP controllers (the
local TAP controllers
refers to the TAP controllers of the scan compo-
nents that make up a local scan ring). Park is also used to describe the action of parking a LSP (transi-
tioning into one of the Parked LSP controller states). It is important to understand that when a LSP
controller is in one of the parked states, TMS
L
is held constant, thereby holding or
parking
the local
TAP controllers in a given state.
Test Access Port as defined by IEEE Std. 1149.1
Selected/Unselected
Selected and Unselected refers to the state of the SCANPSC110F Bridge Selection Controller. A
selected SCANPSC110F has been properly addressed and is ready to receive Level 2 protocol. Unse-
lected SCANPSC110Fs monitor the system test backplane, but do not accept Level 2 protocol (except
for the
GOTOWAIT
instruction). The data registers and LSPs of unselected SCANPSC110Fs are not
accessible from the system test master.
Active Scan Chain
The Active Scan Chain refers to the scan chain configuration as seen by the test master at a given
moment. When a SCANPSC110F is selected with all of its LSPs parked, the active scan chain is the
current scan bridge register only. When a LSP is unparked, the active scan chain becomes: TDI
the
current SCANPSC110F register
the local scan ring registers
a PAD bit
TDO
B
. Refer to Table 4
for Unparked configurations of the LSP network.
Level 1 Protocol
Level 1 is the protocol used to address a SCANPSC110F.
Level 2 Protocol
Level 2 is the protocol that is used once a SCANPSC110F is selected. Level 2 protocol is IEEE Std.
1149.1 compliant when an individual SCANPSC110F is selected.
PAD
A one bit register that is placed at the end of each local scan port scan-chain. The PAD bit eliminates
the prop delay that would be added by the SCANPSC110F LSPN logic between TDI
and TDO
or TDO
by buffering and synchronizing the TDI
inputs to the falling edge of TCK
B
, thus allowing data
to be scanned at higher frequencies without violating set-up and hold times.
LSB
Least Significant Bit, the right-most position in a register (bit 0)
MSB
Most Significant Bit, the left-most position in a register
LSP
Local
Park/Unpark
TAP
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