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256Mb: x16 Mobile SDRAM
MobileRamY26L_A.p65 – Pub. 5/02
Micron Technology, Inc., reserves the right to change products or specifications without notice.
2002, Micron Technology, Inc.
256Mb: x16
MOBILE SDRAM
ADVANCE
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS - V version
(Notes: 1, 5, 6; notes appear on page 37; V
DD
= 2.5 ±0.2V, V
DDQ
= +1.8V ±0.15V )
PARAMETER/CONDITION
SUPPLY VOLTAGE
I/O SUPPLY VOLTAGE
INPUT HIGH VOLTAGE: Logic 1; All inputs
INPUT LOW VOLTAGE: Logic 0; All inputs
DATA OUTPUT HIGH VOLTAGE: Logic 1; All inputs
DATA OUTPUT LOW VOLTAGE: LOGIC 0; All inputs
INPUT LEAKAGE CURRENT:
Any input 0V
≤
V
IN
≤
V
DD
(All other pins not under test = 0V)
OUTPUT LEAKAGE CURRENT: DQs are disabled; 0V
≤
V
OUT
≤
V
DD
Q
SYMBOL
V
DD
V
DDQ
V
IH
V
IL
V
OH
V
OL
I
I
MIN
2.3
1.65
1.25
-0.3
MAX
2.7
1.95
V
DD
+ 0.3
0.55
–
0.2
1.0
UNITS NOTES
V
V
V
V
V
V
μA
22
22
V
DD
Q -0.2
–
-1.0
I
OZ
-1.5
1.5
μA
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS - H version
(Notes: 1, 5, 6; notes appear on page 37; V
DD
= 1.8 ±0.15V, V
DDQ
= +1.8V ±0.15V )
PARAMETER/CONDITION
SUPPLY VOLTAGE
I/O SUPPLY VOLTAGE
INPUT HIGH VOLTAGE: Logic 1; All inputs
INPUT LOW VOLTAGE: Logic 0; All inputs
DATA OUTPUT HIGH VOLTAGE: Logic 1; All inputs
DATA OUTPUT LOW VOLTAGE: LOGIC 0; All inputs
INPUT LEAKAGE CURRENT:
Any input 0V
≤
V
IN
≤
V
DD
(All other pins not under test = 0V)
OUTPUT LEAKAGE CURRENT: DQs are disabled; 0V
≤
V
OUT
≤
V
DD
Q
SYMBOL
V
DD
V
DDQ
V
IH
V
IL
V
OH
V
OL
I
I
MIN
1.65
1.65
0.8*V
DD
Q
-0.3
V
DD
Q -0.2
–
-1.0
MAX
1.95
1.95
V
DD
+ 0.3
0.3
–
0.2
1.0
UNITS NOTES
V
V
V
V
V
V
μA
22
22
I
OZ
-1.5
1.5
μA
ABSOLUTE MAXIMUM RATINGS*
Voltage on V
DD
/V
DD
Q Supply
Relative to V
SS
(2.5V)..........................-0.5V to +3.6V
Relative to V
SS
(1.8V)....................... -0.35V to +2.8V
Voltage on Inputs, NC or I/O Pins
Relative to V
SS
(1.8V)...................... -0.35V to +2.8V
Operating Temperature,
T
A
(industrial; IT parts) ..................... -40°C to +85°C
Storage Temperature (plastic) ............-55°C to +150°C
Power Dissipation ........................................................ 1W
*Stresses greater than those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only, and functional
operation of the device at these or any other conditions
above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.