參數(shù)資料
型號(hào): HYB18T512160AF
廠商: INFINEON TECHNOLOGIES AG
英文描述: 512-Mbit DDR2 SDRAM
中文描述: 512兆位DDR2 SDRAM的
文件頁(yè)數(shù): 81/117頁(yè)
文件大?。?/td> 2102K
代理商: HYB18T512160AF
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Data Sheet
81
Rev. 1.3, 2005-01
09112003-SDM9-IQ3P
HYB18T512[40/80/16]0AF–[3/3S/3.7/5]
512-Mbit DDR2 SDRAM
AC & DC Operating Conditions
5.4
Output Buffer Characteristics
Table 31
Symbol
I
OH
I
OL
SSTL_18 Output DC Current Drive
Parameter
Output Minimum Source DC Current
Output Minimum Sink DC Current
SSTL_18
–13.4
13.4
Unit
mA
mA
Note
1)2)
1)
V
DDQ
= 1.7 V;
V
OUT
= 1.42 V. (
V
OUT
V
DDQ
) /
I
OH
must be less than 21 Ohm for values of
V
OUT
between
V
DDQ
and
V
DDQ
– 280 mV.
2) The values of
I
OH(dc)
and
I
OL(dc)
are based on the conditions given in
1)
and
3)
. They are used to test drive current capability
to ensure
V
IH.MIN
. plus a noise margin and
V
IL.MAX
minus a noise margin are delivered to an SSTL_18 receiver. The actual
current values are derived by shifting the desired driver operating points along 21 Ohm load line to define a convenient
current for measurement.
3)
V
DDQ
= 1.7 V;
V
OUT
= 280 mV.
V
OUT
/
I
OL
must be less than 21 Ohm for values of
V
OUT
between 0 V and 280 mV.
2)3)
Table 32
Symbol
V
OH
V
OL
V
OTR
SSTL_18 Output AC Test Conditions
Parameter
Minimum Required Output Pull-up
Maximum Required Output Pull-down
Output Timing Measurement Reference Level
SSTL_18
V
TT
+ 0.603
V
TT
– 0.603
0.5
×
V
DDQ
Unit
V
V
V
Note
1)
1) SSTL_18 test load for
V
OH
and
VOL
is different from the referenced load described in
Chapter 8.1
. The SSTL_18 test load
has a 20 Ohm series resistor additionally to the 25 Ohm termination resistor into
V
TT
. The SSTL_18 definition assumes that
±
335 mV must be developed across the effectively 25 Ohm termination resistor (13.4 mA
×
25 Ohm = 335 mV). With an
additional series resistor of 20 Ohm this translates into a minimum requirement of 603 mV swing relative to
V
TT
, at the ouput
device (13.4 mA
×
45 Ohm = 603 mV).
1)
Table 33
Symbol
OCD Default Characteristics
Description
Output Impedance
Pull-up / Pull down mismatch
Output Impedance step size
for OCD calibration
Output Slew Rate
Min.
12.6
0
0
Nominal
18
Max.
23.4
4
1.5
Unit
Ohms
Ohms
Ohms
Note
1)2)
1) Absolute Specifications (
T
OPER
;
V
DD
= 1.8 V
±
0.1 V;
V
DDQ = 1.8 V
±
0.1 V), altering OCD from default state no longer
requires DRAM to meet timing, voltage and slew rate specifications on I/O’s.
2) Impedance measurement condition for output source dc current:
V
DDQ
= 1.7 V,
V
OUT
= 1420 mV;
(
V
OUT
V
DDQ
) /
I
OH
must be less than 23.4 ohms for values of
V
OUT
between
V
DDQ
and
V
DDQ
– 280 mV. Impedance
measurement condition for output sink dc current:
V
DDQ
= 1.7 V;
V
OUT
= –280 mV;
V
OUT
/
I
OL
must be less than 23.4 Ohms
for values of
V
OUT
between 0 V and 280 mV.
3) Mismatch is absolute value between pull-up and pull-down, both measured at same temperature and voltage.
4) This represents the step size when the OCD is near 18 ohms at nominal conditions across all process parameters and
represents only the DRAM uncertainty. A 0 Ohm value (no calibration) can only be achieved if the OCD impedance is 18
±
0.75 Ohms under nominal conditions.
5) Slew Rates according to
Chapter 8.2.1
V
IL(ac)
to
V
IH(ac)
with the load specified in
Figure 72
.
6) The absolute value of the Slew Rate as measured from DC to DC is equal to or greater than the Slew Rate as measured
from AC to AC. This is verified by design and characterization but not subject to production test.
7) Timing skew due to DRAM output Slew Rate mis-match between DQS / DQS and associated DQ’s is included in
t
DQSQ
and
t
QHS
specification.
8) DRAM output Slew Rate specification applies to 400, 533 and 667 MHz speed bins.
1)2)3)
4)
S
OUT
1.5
5.0
V / ns
1)5)6)7)8)
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