參數(shù)資料
型號(hào): HY27UA081G1M-TIB
廠商: HYNIX SEMICONDUCTOR INC
元件分類: PROM
英文描述: 128M X 8 FLASH 3.3V PROM, 12000 ns, PDSO48
封裝: 12 X 20 MM, 1.20 MM HEIGHT, TSOP1-48
文件頁(yè)數(shù): 20/43頁(yè)
文件大?。?/td> 729K
代理商: HY27UA081G1M-TIB
Rev 0.5 / Oct. 2004
27
HY27UA(08/16)1G1M Series
HY27SA(08/16)1G1M Series
1Gbit (128Mx8bit / 64Mx16bit) NAND Flash
Table 13: DC Characteristics, 3.3V Device and 1.8V Device
Symbol
Parameter
Test Condition
3.3V
1.8V
Unit
Min
Typ
Max
Min
Typ
Max
ICC1
Operating
Current
Sequential Read
tRLRL minimum
CE=VIL, IOUT = 0 mA
-
15
30
-
10
20
mA
ICC2
Program
-
15
30
-
10
20
mA
ICC3
Erase
-
15
30
-
10
20
mA
ICC4
Stand-by Current (TTL)
CE=VIH, WP=0V/
VCC
--
1
-
1
mA
ICC5
Stand-By Current (CMOS)
CE=VCC-0.2, WP=0/
VCC
-
20
100
-
20
100
uA
ILI
Input Leakage Current
VIN= 0 to VCCmax
-
±
20
-
±
20
uA
ILO
Output Leakage Current
VOUT= 0 to VCCmax
-
±
20
-
±
20
uA
VIH
Input High Voltage
-
2.0
-
VCC+0.3 VCC+0.4
VCC+0.3
V
VIL
Input Low Voltage
-
-0.3
-
0.8
-0.3
0.4
V
VOH
Output High Voltage Level
IOH = -400uA
2.4
-
VCC-0.1
-
V
VOL
Output Low Voltage Level
IOL = 2.1mA
-
0.4
-
0.1
V
IOL(RB)
Output Low Current (RB)
VOL = 0.1V
8
10
-
3
4
-
mA
VLKO
VDD Supply Voltage
(Erase and Program lockout)
--
-
2.5
-
1.5
V
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