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B900
Advance Data Sheet
Baseband Signal Processor
July 1999
70
Lucent Technologies Inc.
6 Device Requirements and Characteristics
This section describes B900 device requirements and characteristics.
6.1
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-
lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess
of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended
periods can adversely affect device reliability.
Absolute maximum ratings are the limiting conditions that can be applied to all variations of circuit and environmen-
tal conditions without the occurrence of permanent damage.
External leads can be bonded and soldered safely at temperatures of up to 300 °C.
6.2
Handling Precautions
All MOS devices must be handled with certain precautions to avoid damage due to the accumulation of static
charge. Although input protection circuitry has been incorporated into the devices to minimize the effect of this
static buildup, proper precautions should be taken to avoid exposure to electrostatic discharge during handling and
mounting.
Lucent employs a human-body model for ESD-susceptibility testing. Because the failure voltage of electronic
devices is dependent on the current, voltage, and hence, the resistance and capacitance, it is important that stan-
dard values be employed to establish a reference by which to compare test data. Values of 100 pF and 1500 V are
the most common and are the values used in the Lucent human-body model test circuit. The breakdown voltage for
the B900 is greater than 2000 V.
Table 88. Maximum Package Rating Parameters and Values
Parameter
Min
Max
Unit
Voltage on Any Pin with Respect to Ground
VSS – 0.5
VDD + 0.5
V
Power Dissipation
—
0.75
W
Ambient Temperature
–40
85
°C
Storage Temperature
–65
150
°C