參數(shù)資料
型號(hào)： SCANPSC100F
廠商： Fairchild Semiconductor Corporation
英文描述： Embedded Boundary Scan Controller (IEEE 1149.1 Support)
中文描述： 嵌入式邊界掃描控制器協(xié)會(huì)（IEEE 1149.1支援）
文件頁(yè)數(shù)： 18/21頁(yè)
文件大?。?/td> 208K
代理商： SCANPSC100F
www.fairchildsemi.com
18
S
Absolute Maximum Ratings
(Note 7)
Recommended Operating
Conditions
Note 7:
Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, with-
out exception, to ensure that the system design is reliable over its power
supply, temperature, and output/input loading variables. Fairchild does not
recommend operation of SCAN outside of recommended operation condi-
tions.
DC Electrical Characteristics
Supply Voltage (V
CC
)
DC Input Diode Current (I
IK
)
V
I
=
0.5V
V
I
=
V
CC
+
0.5V
DC Input Voltage (V
I
)
DC Output Diode Current (I
OK
)
V
O
=
0.5V
V
O
=
V
CC
+
0.5V
DC Output Voltage (V
O
)
DC Output Source/Sink Current (I
O
)
DC V
CC
or Ground Current
per Output Pin
DC Latchup Source or Sink Current
Junction Temperature
SOIC
Storage Temperature
ESD Last Passing Voltage (Min)
0.5V to
+
7.0V
20 mA
+
20 mA
0.5V to V
CC
+
0.5V
20 mA
+
20 mA
0.5V to V
CC
+
0.5V
±
50 mA
±
50 mA
±
300 mA
+
140
°
C
65
°
C to
+
150
°
C
4000V
Supply Voltage (V
CC
)
SCANPSC100F
Input Voltage (V
I
)
Output Voltage (V
O
)
Operating Temperature (T
A
)
Minimum Input Edge Rate
V/
t
SCAN
“
F
”
Series Devices
V
IN
from 0.8V to 2.0V
V
CC
@ 4.5V, 5.5V
4.5V to 5.5V
0V to V
CC
0V to V
CC
40
°
C to
+
85
°
C
125 mV/ns
Symbol
Parameter
V
CC
(V)
4.5
5.5
4.5
T
A
=
+
25
°
C
Typ
T
A
=
40
°
C to
+
85
°
C
Guaranteed Limits
Units
Conditions
V
IH
Minimum HIGH
Input Voltage
Maximum LOW
2.0
2.0
0.8
2.0
2.0
0.8
V
V
OUT
=
0.1V or
V
CC
0.1V
V
OUT
=
0.1V or
V
CC
0.1V
V
IL
V
Input Voltage
Minimum HIGH
Output Voltage
5.5
4.5
5.5
0.8
4.4
5.4
0.8
4.4
5.4
V
OH
V
I
OUT
=
50
μ
A
4.5
5.5
3.86
4.86
3.76
4.76
V
IN
=
V
IL
or V
IH
I
OH
=
24 mA
All Outputs Loaded
V
V
OL
Maximum LOW
Output Voltage
4.5
5.5
4.5
0.1
0.1
0.36
0.1
0.1
0.44
V
I
OUT
=
50
μ
A
V
IN
=
V
IL
or V
IH
I
OL
=
24 mA
All Outputs Loaded
5.5
0.36
0.44
V
I
IN
Maximum Input
Leakage Current
5.5
±
0.1
±
1.0
μ
A
V
IN
=
V
CC
for TDI, OE
V
IN
=
V
CC
, GND for All Others
V
IN
=
GND for
TDI, OE Only
V
OLD
=
1.65V Max
Maximum Test Duration
=
2.0 ms,
One Output Loaded at a Time
V
OHD
=
3.85V Min
Maximum Test Duration
=
2.0 ms,
One Output Loaded at a Time
V
IN
=
V
CC
, GND
V
IN
(OE, R/W, CE, STB)
=
V
IL
, V
IH
V
IN
=
V
CC
, GND
V
O
=
V
CC
, GND
V
IN
(R/W, CE, STB)
=
V
IL
, V
IH
I
ILR
Maximum Input
Leakage Current
Minimum
5.5
385
385
μ
A
I
OLD
Dynamic
Output Current
Minimum
5.5
75
mA
I
OHD
Dynamic
Output Current
Maximum 3-STATE
5.5
75
mA
I
OZ
±
0.5
±
5.0
μ
A
Leakage Current
Maximum I/O
Leakage Current
I
OZT
±
0.6
±
6.0
μ
A
I
CC
Maximum Quiescent
Supply Current
5.5
8
80
μ
A
TDI, OE Float
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