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參數(shù)資料
| 型號： | ADUC7032BSTZ-8V-RL |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 90/128頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC BATTERY SENSOR PREC 48-LQFP |
| 標準包裝： | 1 |
| 系列： | MicroConverter® ADuC7xxx |
| 核心處理器： | ARM7 |
| 芯體尺寸： | 16/32-位 |
| 速度： | 20.48MHz |
| 連通性： | LIN，SPI，UART/USART |
| 外圍設備： | POR，PSM，溫度傳感器，WDT |
| 輸入/輸出數(shù)： | 9 |
| 程序存儲器容量： | 96KB（48K x 16） |
| 程序存儲器類型： | 閃存 |
| RAM 容量： | 1.5K x 32 |
| 電壓 - 電源 (Vcc/Vdd)： | 3.5 V ~ 18 V |
| 數(shù)據(jù)轉換器： | A/D 2x16b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 105°C |
| 封裝/外殼： | 48-LQFP |
| 包裝： | 標準包裝 |
| 其它名稱： | ADUC7032BSTZ-8V-RLDKR |
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Preliminary Technical Data
ADuC7032
Rev. PrD | Page 64 of 128
ADC Calibration
As described in detail in the top level diagrams at the start of
this section, the signal flow through all ADC Channels can be
described in simple terms as:
An Input-voltage is applied through an input buffer
(and PGA in the case of the I-ADC) to the Sigma-
Delta Modulator.
The Modulator-output is applied to a programmable
Digital Decimation Filter
The filter output result is then averaged if chopping is
used.
An Offset value (ADCxOF) is subtracted from the
result.
This result is scaled by a Gain value (ADCxGN).
Finally, the result is formatted as
- 2’s Complement. / Offset-Binary,
- Rounded to 16-Bit
- Clamped to +/-Full-Scale
Each ADC has a specific Offset and Gain correction or
Calibration coefficient associated with it that are stored in
MMR
based
Offset
and
Gain
registers(ADCxOF
and
ADCxGN). The offset and gain registers can be used to remove
offsets and gain errors arising within the part as well as System-
level offset and gain errors external to the part.
These registers are configured at power-on with a factory
programmed calibration value. These factory calibration values
will vary from part to part reflecting the manufacturing
variability of internal ADC circuits . However, these registers
can also be overwritten by user code (only if the ADC is in idle
mode) and will be automatically overwritten if an offset or gain
calibration cycle is initiated by user via the mode bits in the
ADCMDE[2:0] MMR. 2 types of automatic calibration are
available to the user, namely :
- Self (Offset or Gain) Calibration
, where the ADC
generates its calibration coefficient based on an
internally generated 0V in the case of Self-Offset
calibration and full-scale voltage in the case of Self-Gain
calibration. It should be emphasized that ADC Self-
Calibrations correct for offset and gain errors within the
ADC. Self calibrations cannot compensate for other
external errors in the system, e.g. Shunt-Resistor
tolerance/drift, external offset voltages etc.
- System (Offset or Gain) Calibration
, where the ADC
generates its calibration coefficient based on an
externally generated zero-scale voltage in the case of
System-Offset calibration and Full-scale voltage in the
case of System-Gain calibration which are applied to the
external ADC input for the duration of the calibration
cycle.
The duration of an Offset calibration is 1 single conversion
cycle (3/FADC Chop off, 2/FADC Chop on) before returning the
ADC to idle mode. A Gain calibration is a 2 stage process and
subsequently takes twice as long as an offset calibration cycle.
Once a calibration cycle is initiated, any ongoing ADC
conversion is immediately halted, the calibration is carried out
automatically at an ADC update rate programmed into
ADCFLT and the ADC is always returned to idle after any
calibration cycle. It is strongly recommended that ADC
calibration is initiated at as low an ADC update rate as possible
(high SF value in ADCFLT) in order to minimize the impact of
ADC noise during calibration.
NOTE:
ADC0OF and ADC0GN must first contain the values
for PGA = 1 before a calibration scheme is started
Using the Offset and Gain Calibration Registers
If the Chop bit (ADCFLT[15]) is enabled, then internal ADC
offset errors will be minimized and an Offset calibration may
not be required. If chopping is disabled however, an initial
Offset calibration will be required and may need to be repeated.
A Gain calibration, particularly in the context of the I-ADC
(with internal PGA) may need to be carried out at all relevant
system gain ranges depending on system accuracy
requirements. If it is not possible to apply an external full-scale
current on all gain ranges then it is possible to apply a lower
current, and scale the result produced by the calibration. e.g
Apply a 50% current and then divide the ADC0GN value
produced by 2 and write this value back into ADC0GN. It
should be noted that there is a lower limit to the input signal
that can be applied for a System-Calibration because the
ADC0GN register is only 16-Bit. The input span (difference
between the System Zero-Scale value and System Full-Scale
value) should be greater than 40% of the nominal Full-Scale-
Input range, ie > 40% of Vref/Gain.
The on-chip Flash/EE memory can be used to store multiple
calibration coefficients which can be copied by user code
directly into the relevant calibration registers as appropriate
based on system configuration. In general, the simplest way to
use the calibration registers is to let the ADC calculate the
values required as part of the ADC automatic calibration
modes.
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| ADUC7033BSTZ-88 | 功能描述:IC BATT SENSOR PREC 48LQFP RoHS:是 類別:集成電路 (IC) >> PMIC - 電池管理 系列:- 標準包裝:2,000 系列:Impedance Track™ 功能:燃料，電量檢測計/監(jiān)控器 電池化學:鋰離子（Li-Ion） 電源電壓:2.4 V ~ 2.6 V 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:20-TSSOP（0.173"，4.40mm 寬） 供應商設備封裝:20-TSSOP 包裝:帶卷 (TR) 產(chǎn)品目錄頁面:1020 (CN2011-ZH PDF) 配用:BQ27350EVM-ND - BQ27350EVM 其它名稱:296-21665-2 |
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