參數(shù)資料
型號: TPA5050_07
廠商: Texas Instruments, Inc.
英文描述: STEREO DIGITAL AUDIO LIP-SYNC DELAY WITH I2C CONTROL
中文描述: 立體聲數(shù)字音頻口形同步延遲與I2C控制
文件頁數(shù): 1/21頁
文件大?。?/td> 782K
代理商: TPA5050_07
TPA5050
www.ti.com
FEATURES
Digital Audio Formats: 16-24-bit I
2
S,
Right-Justified, Left-Justified
I
2
C Bus Controlled
Single Serial Input Port
Delay Time: 170 ms/ch at fs = 48 kHz
Delay Resolution: One Sample
Delay Memory Cleared on Power-Up or After
Delay Changes
Eliminates Erroneous Data From Being
Output
3.3 V Operation With 5 V Tolerant I/O and I
2
C
Control
Supports Audio Bit Clock Rates of 32 to 64 fs
with fs = 32 kHz–192 kHz
No external crystal or oscillator required
All Internal Clocks Generated From the
Audio Clock
Surface Mount 4mm
×
4mm, 16-pin QFN
Package
APPLICATIONS
High Definition TV Lip-Sync Delay
Flat Panel TV Lip-Sync Delay
Home Theater Rear-Channel Effects
Wireless Speaker Front-Channel
Synchronization
DESCRIPTION
The TPA5050 accepts a single serial audio input,
buffers the data for a selectable period of time, and
outputs the delayed audio data on a single serial
output. One device allows delay of up to 170 ms/ch
(fs = 48 kHz) to synchronize the audio stream to the
video
stream
in
systems
processing algorithms. If more delay is needed, the
devices can be connected in series.
SIMPLIFIED APPLICATION DIAGRAM
BCLK
LRCLK
DATA
DATA_OUT
3
3.3 V
BCLK
LRCLK
DATA
TPA5050
Digital Amplifier
SCLK
Audio Processor
SCLK
BCLK
LRCLK
DATA
S
S
A
(
I2
Control
V
G
TAS3103A
or
ATSC
Processor
TAS5504A
+TAS5122
TPA5050
SLOS492B–MAY 2006–REVISED MAY 2007
STEREO DIGITAL AUDIO LIP-SYNC DELAY WITH I
2
C CONTROL
with
complex
video
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright 2006–2007, Texas Instruments Incorporated
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