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參數(shù)資料
| 型號： | SN74ABT182502A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| 中文描述： | 掃描測試設(shè)備與18位通用總線收發(fā)器（掃描測試裝置（帶18位通用總線收發(fā)器）） |
| 文件頁數(shù)： | 22/35頁 |
| 文件大?。?/td> | 738K |
| 代理商： | SN74ABT182502A |
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SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
22
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
simultaneous PSA and binary count up (PSA/COUNT)
Data appearing at the selected device input-mode I/O pins is compressed into an 18-bit parallel signature in the
shift-register elements of the selected input-mode BSCs on each rising edge of TCK. At the same time, an 18-bit
binary count-up pattern is generated in the shift-register elements of the selected output-mode BSCs on each
rising edge of TCK, updated in the shadow latches, and applied to the associated device I/O pins on each falling
edge of TCK. Figures 11 and 12 illustrate the 18-bit linear-feedback shift-register algorithms through which the
signature is generated. An initial seed value should be scanned into the BSR before performing this operation.
1B8-I/O
1B7-I/O
1B6-I/O
1B5-I/O
1B4-I/O
1B3-I/O
1B2-I/O
1B1-I/O
1B9-I/O
1A7-I/O
1A6-I/O
1A5-I/O
1A4-I/O
1A3-I/O
1A2-I/O
1A1-I/O
1A8-I/O
1A9-I/O
2A7-I/O
2A6-I/O
2A5-I/O
2A4-I/O
2A3-I/O
2A2-I/O
2A1-I/O
2A8-I/O
2A9-I/O
2B8-I/O
2B7-I/O
2B6-I/O
2B5-I/O
2B4-I/O
2B3-I/O
2B2-I/O
2B1-I/O
2B9-I/O
MSB
LSB
=
=
Figure 11. 18-Bit PSA/COUNT Configuration (1OEAB = 2OEAB = 0, 1OEBA = 2OEBA = 1)
P
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ABT18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN54ABT182502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN54ABT18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN74AHC16245 | 16-Bit Bus Transceivers With 3-State Outputs(16位緩沖器/驅(qū)動器(三態(tài)輸出)) |
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74ABT18502 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN74ABT18502_06 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN74ABT18502PM | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PMG4 | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PMR | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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