參數(shù)資料
型號(hào): SN74ABT182502A
廠商: Texas Instruments, Inc.
英文描述: Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器))
中文描述: 掃描測(cè)試設(shè)備與18位通用總線收發(fā)器(掃描測(cè)試裝置(帶18位通用總線收發(fā)器))
文件頁(yè)數(shù): 11/35頁(yè)
文件大?。?/td> 738K
代理商: SN74ABT182502A
SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the RUNT instruction
to implement additional test operations not included in the basic SCOPE
instruction set. Such operations
include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation.
The BCR order of scan is illustrated in Figure 3.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 3. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation.
During Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is illustrated in
Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
P
相關(guān)PDF資料
PDF描述
SN74ABT18502A Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器))
SN54ABT182502A Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器))
SN54ABT18502A Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器))
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