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參數(shù)資料
| 型號： | SN74ABT182502A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| 中文描述： | 掃描測試設備與18位通用總線收發(fā)器（掃描測試裝置（帶18位通用總線收發(fā)器）） |
| 文件頁數(shù)： | 15/35頁 |
| 文件大?。?/td> | 738K |
| 代理商： | SN74ABT182502A |
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SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
15
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register opcode description
The BCR opcodes are decoded from BCR bits 2–0 as shown in Table 4. The selected test operation is
performed while the RUNT instruction is executed in the Run-Test/Idle state. The following descriptions detail
the operation of each BCR instruction and illustrate the associated PSA and PRPG algorithms.
Table 4. Boundary-Control Register Opcodes
BINARY CODE
BIT 2
→
BIT 0
MSB
→
LSB
X00
DESCRIPTION
Sample inputs/toggle outputs (TOPSIP)
X01
Pseudo-random pattern generation/36-bit mode (PRPG)
X10
Parallel signature analysis/36-bit mode (PSA)
011
Simultaneous PSA and PRPG/18-bit mode (PSA/PRPG)
111
Simultaneous PSA and binary count up/18-bit mode (PSA/COUNT)
In general, while the control input BSCs (bits 47–36) are not included in the toggle, PSA, PRPG, or COUNT
algorithms, the output-enable BSCs (bits 47–44 of the BSR) control the drive state (active or high impedance)
of the selected device output pins. These BCR instructions are valid only when both bytes of the device are
operating in one direction of data flow (that is, 1OEAB
≠
1OEBA and 2OEAB
≠
2OEBA) and in the same
direction of data flow (that is, 1OEAB
=
2OEAB and 1OEBA
=
2OEBA). Otherwise, the bypass instruction is
operated.
sample inputs/toggle outputs (TOPSIP)
Data appearing at the selected device input-mode I/O pins is captured in the shift-register elements of the
associated BSCs on each rising edge of TCK. Data in the shift-register elements of the selected output-mode
BSCs is toggled on each rising edge of TCK, updated in the shadow latches, and applied to the associated
device I/O pins on each falling edge of TCK.
P
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ABT18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN54ABT182502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN54ABT18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN74AHC16245 | 16-Bit Bus Transceivers With 3-State Outputs(16位緩沖器/驅(qū)動器(三態(tài)輸出)) |
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74ABT18502 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN74ABT18502_06 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN74ABT18502PM | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PMG4 | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PMR | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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