參數(shù)資料
型號: SN74ABT18502A
廠商: Texas Instruments, Inc.
英文描述: Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器))
中文描述: 掃描測試設(shè)備與18位通用總線收發(fā)器(掃描測試裝置(帶18位通用總線收發(fā)器))
文件頁數(shù): 1/35頁
文件大?。?/td> 738K
代理商: SN74ABT18502A
SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
Copyright
1994, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Members of the Texas Instruments
Widebus
Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
UBT
(Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
B-Port Outputs of
ABT182502A Devices
Have Equivalent 25-
Series Resistors, So
No External Resistors Are Required
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
Significantly Reduces Power Dissipation
One Boundary-Scan Cell Per I/O
Architecture Improves Scan Efficiency
SCOPE
Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat (HV) Packages Using
25-mil Center-to-Center Spacings
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
N
T
1
1
1
1
G
1
1
T
N
T
2
2
2
G
2
2
2
T
2
2
1
1
G
2
2
2
G
1
1
1
SN54ABT18502A, SN54ABT182502A . . . HV PACKAGE
(TOP VIEW)
C
V
C
NC – No internal connection
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
28 29 30 31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
SCOPE, Widebus, UBT, and EPIC-
II
B are trademarks of Texas Instruments Incorporated.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
P
相關(guān)PDF資料
PDF描述
SN54ABT182502A Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器))
SN54ABT18502A Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器))
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74ABT18502PM 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18502PMG4 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18502PMR 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18502PMRG4 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18502PN 制造商:TI 功能描述:74ABT18502 S1A4B