- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄372164 > SN74ABT18502A (Texas Instruments, Inc.) Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器)) PDF資料下載
參數(shù)資料
| 型號(hào)： | SN74ABT18502A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器)) |
| 中文描述： | 掃描測(cè)試設(shè)備與18位通用總線收發(fā)器（掃描測(cè)試裝置（帶18位通用總線收發(fā)器）） |
| 文件頁(yè)數(shù)： | 32/35頁(yè) |
| 文件大?。?/td> | 738K |
| 代理商： | SN74ABT18502A |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)第29頁(yè)第30頁(yè)第31頁(yè)當(dāng)前第32頁(yè)第33頁(yè)第34頁(yè)第35頁(yè)
SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
32
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted) (continued)
PARAMETER
TEST CONDITIONS
TA = 25
°
C
TYP
SN54ABT182502A
MIN
SN74ABT182502A
MIN
UNIT
MIN
MAX
MAX
MAX
Ci
Control
inputs
VI = 2.5 V or 0.5 V
5
pF
Cio
Co
* On products compliant to MIL-STD-883, Class B, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
A or B ports
VO = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
10
pF
TDO
8
pF
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 14)
12
SN54ABT182502A
MIN
SN74ABT182502A
MIN
UNIT
MAX
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
0
100
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
3.5
ns
LEAB or LEBA high
A before CLKAB
↑
or B before CLKBA
↑
3.5
Setup time
3.5
tsu
A before LEAB
↓
or B before LEBA
↓
CLK high
3.5
ns
CLK low
2
th
Hold time
A after CLKAB
↑
or B after CLKBA
↑
A after LEAB
↓
or B after LEBA
↓
0.5
ns
3
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 14)
SN54ABT182502A
MIN
SN74ABT182502A
MIN
UNIT
MAX
MAX
fclock
tw
Clock frequency
TCK
0
50
0
50
MHz
Pulse duration
TCK high or low
A, B, CLK, LE, or OE before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, LE, or OE after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
8
ns
Setup time
6
tsu
4.5
ns
3
H ld i
Hold time
1.5
th
1
ns
1.5
td
tr
Delay time
50
ns
μ
s
Rise time
1
P
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABT182502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器)) |
| SN54ABT18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器)) |
| SN74AHC16245 | 16-Bit Bus Transceivers With 3-State Outputs(16位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出)) |
| SN74AHC240DBRG4 | OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN74AHCT27 | Triple 3-Input Positive-NOR Gates(三3輸入正或非門) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74ABT18502PM | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PMG4 | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PMR | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PMRG4 | 功能描述:特定功能邏輯 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18502PN | 制造商:TI 功能描述:74ABT18502 S1A4B |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。