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參數(shù)資料
| 型號(hào)： | EP1K50FI256-2N |
| 廠商： | Altera |
| 文件頁(yè)數(shù)： | 40/86頁(yè) |
| 文件大小： | 0K |
| 描述： | IC ACEX 1K FPGA 50K 256-FBGA |
| 產(chǎn)品培訓(xùn)模塊： | Three Reasons to Use FPGA's in Industrial Designs |
| 標(biāo)準(zhǔn)包裝： | 90 |
| 系列： | ACEX-1K® |
| LAB/CLB數(shù)： | 360 |
| 邏輯元件/單元數(shù)： | 2880 |
| RAM 位總計(jì)： | 40960 |
| 輸入/輸出數(shù)： | 186 |
| 門數(shù)： | 199000 |
| 電源電壓： | 2.375 V ~ 2.625 V |
| 安裝類型： | 表面貼裝 |
| 工作溫度： | -40°C ~ 85°C |
| 封裝/外殼： | 256-BGA |
| 供應(yīng)商設(shè)備封裝： | 256-FBGA（17x17） |
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Altera Corporation
45
ACEX 1K Programmable Logic Device Family Data Sheet
D
e
ve
lo
pm
e
n
t
13
To
o
ls
Generic Testing
Each ACEX 1K device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100% yield. AC test measurements for ACEX 1K
devices are made under conditions equivalent to those shown in
Figure 21. Multiple test patterns can be used to configure devices during
all stages of the production flow.
Figure 21. ACEX 1K AC Test Conditions
Operating
Conditions
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V ACEX 1K devices.
To Test
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
Device
Output
703
8.06 k
[481
]
[481
]
VCCIO
Power supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast-ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test system
ground, significant reductions in
observable noise immunity can result.
Numbers in brackets are for 2.5-V devices
or outputs. Numbers without brackets are
for 3.3-V devices or outputs.
Table 18. ACEX 1K Device Absolute Maximum Ratings
Symbol
Parameter
Conditions
Min
Max
Unit
VCCINT
Supply voltage
With respect to ground (2)
–0.5
3.6
V
VCCIO
–0.5
4.6
V
VI
DC input voltage
–2.0
5.75
V
IOUT
DC output current, per pin
–25
25
mA
TSTG
Storage temperature
No bias
–65
150
°
C
TAMB
Ambient temperature
Under bias
–65
135
°
C
TJ
Junction temperature
PQFP, TQFP, and BGA packages, under
bias
135
°
C
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