參數(shù)資料
型號: NAND01GW4A2BV1E
廠商: 意法半導(dǎo)體
英文描述: 128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16) 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
中文描述: 128兆,256兆,512兆位,1千兆位(x8/x16)528 Byte/264字的頁面,1.8V/3V,NAND閃存芯片
文件頁數(shù): 34/57頁
文件大?。?/td> 410K
代理商: NAND01GW4A2BV1E
NAND128-A, NAND256-A, NAND512-A, NAND01G-A
34/57
DC AND AC PARAMETERS
This section summarizes the operating and mea-
surement conditions, and the DC and AC charac-
teristics of the device. The parameters in the DC
and AC characteristics Tables that follow, are de-
rived from tests performed under the Measure-
ment
16., Operating and AC Measurement Conditions
.
Designers should check that the operating condi-
tions in their circuit match the measurement condi-
tions when relying on the quoted parameters.
Conditions
summarized
in
Table
Table 16. Operating and AC Measurement Conditions
Table 17. Capacitance
Note: T
A
= 25°C, f = 1 MHz. C
IN
and C
I/O
are not 100% tested.
Parameter
NAND Flash
Units
Min
Max
Supply Voltage (V
DD
)
1.8V devices
1.7
1.95
V
3V devices
2.7
3.6
V
Ambient Temperature (T
A
)
Grade 1
0
70
°C
Grade 6
–40
85
°C
Load Capacitance (C
L
) (1 TTL GATE and C
L
)
1.8V devices
30
pF
3V devices (2.7 - 3.6V)
50
pF
3V devices (3.0 - 3.6V)
100
pF
Input Pulses Voltages
1.8V devices
0
V
DD
V
3V devices
0.4
2.4
V
Input and Output Timing Ref. Voltages
1.8V devices
0.9
V
3V devices
1.5
V
Input Rise and Fall Times
5
ns
Output Circuit Resistors, R
ref
8.35
k
Symbol
Parameter
Test Condition
Typ
Max
Unit
C
IN
Input Capacitance
V
IN
= 0V
10
pF
C
I/O
Input/Output Capacitance
V
IL
= 0V
10
pF
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