參數(shù)資料
型號: 9S12E128DGV1
廠商: Motorola, Inc.
英文描述: MC9S12E-Family Device User Guide V01.04
中文描述: MC9S12E -系列設備的用戶手冊V01.04
文件頁數(shù): 131/156頁
文件大?。?/td> 3077K
代理商: 9S12E128DGV1
131
The failure rates for data retention and program/erase cycling are specified at
<
2ppm defects over lifetime
at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
NOTE:
All values shown in
Table B-6
are target values and subject to further extensive
characterization.
Table B-6 NVM Reliability Characteristics
Conditions are shown in
Table A-4
unless otherwise noted
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
C
Data Retention at an average junction temperature of
T
Javg
= 85
°
C
t
NVMRET
15
Years
2
C
Data Retention at a junction temperature of T
J
=
140°
C
t
NVMRET
10
Years
3
C
Flash number of Program/Erase cycles
n
FLPE
10,000
Cycles
F
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
n
.
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