參數(shù)資料
型號： THS8083CPZP
廠商： TEXAS INSTRUMENTS INC
元件分類： 消費家電
英文描述： SPECIALTY CONSUMER CIRCUIT, PQFP100
封裝： POWER, THERMALLY ENHANCED, PLASTIC, TQFP-100
文件頁數(shù)： 40/61頁
文件大?。?/td> 266K
代理商： THS8083CPZP
5–1
5 Electrical Specification
Electrical specifications over recommended operating conditions with Fs = 80 MSPS, (unless otherwise noted)
5.1
Definition of Test Conditions
3.6
s
800 mVPP
1/60 kHz = 16.6
s
Figure 5–1. Input Test Waveform
Test condition SYSTEM_INTREF refers to:
All supplies at 3.3 V
XTL1_MCLK & XTL2 connected at 14.31818 MHz
No power downs enabled
XGA at 75-Hz operation mode, internal clock, clamping enabled, internal clamp timing, coarse and fine
PGAs at midscale, bottom-level clamping, clamp code at midscale, 24-bit output mode
Identical ac-coupled 0.8 Vpp ramp-shape input on all 3 channels at 60.0-kHz line rate, as shown in
Figure 5-1
Use of internal bandgap and voltage references
Test condition PLL refers to:
SYSTEM_INTREF, with an input signal other than the ramp-shape input test waveform of Figure 5–1.
Test condition ADC_INTREF refers to:
All supplies at 3.3 V
Use of internal bandgap and voltage references
Use of external ADCCLK (SEL_ADCCLK = 1) clock, driven at 81.92 MHz
No power downs enabled
Identical ac–coupled 0.8 Vpp ramp-shape input on all three channels at 60.0-kHz line rate, as shown in
Figure 5-1
Test condition ADC_EXTREF refers to:
ADC_INTREF, except: PWDN_BGAP = PWDN_REF = 1, VMID and VREFTO/BO driven from external at
nominal levels
Test condition ADC_PWDN refers to:
ADC_INTREF, except: PWDN_ALL = 1
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