參數(shù)資料
型號: SMFR-29C516ESC
廠商: TEMIC SEMICONDUCTORS
元件分類: 算術邏輯單元
英文描述: 16-BIT ERROR DETECT AND CORRECT CKT, QFP100
封裝: MQFP-100
文件頁數(shù): 36/42頁
文件大小: 809K
代理商: SMFR-29C516ESC
TABLE 7 -ELECTRICAL MEASUREMENTS DURING AND ON COMPLETION OF
IRRADIATION TESTING
CHARACTERISTICS
SYMBOL
SPEC. AND/OR
TEST METHOD
TEST
CONDITIONS
LIMITS
UNIT
MIN MAX
1
Functional Test
VCCmin
-
As per table 2
2
Functional Test
VCCtyp.
-
As per table 2
3
Functional Test
VCCmax
-
As per table 2
4
Low level input current,
Pull_up
IILPU
As per table 2
-100
A
5
High level input current
IIH
As per table 2
10
A
6
Output leakage Low
current
Pull Up Output
IOZLPU
As per table 2
-100
A
7
Output leakage High
current
IOZH
As per table 2
10
A
8
Supply current stand-by
IDDSB
As per table 2
5
mA
10
Low level input voltage
VIL
As per table 2
0.8
V
11
High level input voltage
VIH
As per table 2
2.2
V
12
Low level Output
voltage
VOL
As per table 2
0.4
V
13
High level output
voltage
VOH
As per table 2
3.7
V
NOTES : As per table 2, see page 25
Document number
MHS/SCC 021
Date
Issue
Page
23/12/1999
Rev C
41
Rev C
41 /42
TEMI C
Semiconductors
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