參數(shù)資料
型號： SMFR-29C516ESC
廠商： TEMIC SEMICONDUCTORS
元件分類： 算術(shù)邏輯單元
英文描述： 16-BIT ERROR DETECT AND CORRECT CKT, QFP100
封裝： MQFP-100
文件頁數(shù)： 34/42頁
文件大?。?/td> 809K
代理商： SMFR-29C516ESC
4.4.4.
Die Attachment
21
4.5.
Marking
21
4.5.1.
General
21
4.5.2.
Lead Identification
21
4.5.3.
The Component Number
21
4.5.4.
Traceability Information
22
4.6.
Electrical Measurements
22
4.6.1.
Electrical Measurements at Room Temperature
22
4.6.2.
Electrical Measurements at High and Low Temperature
22
4.6.3.
Circuits for Electrical Measurements
22
4.7.
Burn-in Tests
22
4.7.1.
Parameter Drift Values
22
4.7.2.
Conditions for Power Burn-in
22
4.7.3.
Electrical Circuits for Power Burn-in
22
4.8.
Environmental and Endurance Tests
38
4.8.1.
Electrical Measurements at Completion of Environmental Tests
38
4.8.2.
Electrical Measurements at Intermediate Point during Endurance Tests
38
4.8.3.
Electrical Measurements on Completion of Endurance Tests
38
4.8.4.
Conditions for Operating Life-Tests
38
4.8.5.
Electrical Circuits for Operating Life-Tests
38
4.8.6.
Condition For High Temperature Storage Test
38
4.9.
Total Dose irradiation Testing
38
4.9.1.
Application
38
4.9.2.
Bias Condition
38
4.9.3.
Electrical Measurements
38
TABLES
1 (a)
Type Variants
7
1 (b)
Maximum Ratings
7
1 (c)
Dynamic electrical characteristics
8
2
Electrical measurements at room Temperature - dc Parameters
23
Electrical measurements at room Temperature
- ac Parameters
24
3
Electrical Measurements at High and Low Temperature - dc Parameters
26
Electrical Measurements at High and Low Temperature
- ac Parameters
27
4
Parameter Drift Values
35
5
Conditions for Power Burn-in and Operating Life-Test
36
Document number
MHS/SCC 021
Date
Issue
Page
23/12/1999
Rev C
4
Rev C
4 /42
TEMI C
Semiconductors
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