參數(shù)資料
型號: SMFR-29C516ESC
廠商: TEMIC SEMICONDUCTORS
元件分類: 算術(shù)邏輯單元
英文描述: 16-BIT ERROR DETECT AND CORRECT CKT, QFP100
封裝: MQFP-100
文件頁數(shù): 18/42頁
文件大?。?/td> 809K
代理商: SMFR-29C516ESC
NOTES :
1]Forcing conditions of the functional test, assure that these limits are met, but they will not be individually
recorded .
2]May not be measured, but shall be guaranteed . Tested at initial design and after major process changes
3]Read & Record measurements for level B and Go/No_Go tests for level C
4]The timings correspond to :Supply voltage = 4.5V . Input Conditions are Vil = 0V , VIH = VDD timing
description figure 4(l)
Document number
MHS/SCC 021
Date
Issue
Page
23/12/1999
Rev C
25
Rev C
25 /42
TEMI C
Semiconductors
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