Analog Integrated Circuit Device Data
4
Freescale Semiconductor
33784
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to Analog Ground (AGND) unless otherwise noted. Exceeding these ratings may cause a
malfunction or permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
I/O0, I/O1, I/O2, AN0, AN1, TEST1, TEST2, TOUT Voltage
VIO
-0.3 to VREGOUT + 0.3
V
I/On, ANn, TESTn, TOUT Pin Current
IIO
5.0
mA
BUSOUT Voltage, BUS SW = open
VIN
-14 to 40
V
BUSIN Voltage, BUS SW = open
VIN
-0.3 to 40
V
RTNOUT Voltage, BUS SW = open
VIN
-14 to 25
V
H_CAP Voltage
VIN
-0.3 to 40
V
BUSIN, BUSOUT, and H_CAP Current (Continuous)
IIN
400
mA
BUSIN, RTNIN, reverse current (max 5 ms)
IREVLK
400
mA
RTNIN, RTNOUT Current
IBUSRTN
400
mA
IDDQ Voltage
VIDDQ
2.75
V
VREG Range
VRO
0.3 - 7.0
V
Human Body Model (HBM)
Machine Model (MM)
Charge Device Model (CDM)
Corner pins
All other pins
VESD
±2000
±200
±750
±500
V
THERMAL RATINGS
Storage Temperature
TS
-55 to 150
°C
Operating Ambient Temperature
TA
-40 to 125
°C
Operating Junction Temperature
TJ
-40 to 150
°C
THERMAL RESISTANCE AND PACKAGE DISSIPATION RATINGS
Resistance, Junction-to-Ambient (Single Layer (1s) PCB Board)
RθJA
125
°C/W
Resistance, Junction-to-Board (Multi-Layer (2s2P) PCB Board)
RθJB
62
°C/W
Peak Package Reflow Temperature During Refl
ow(2),(3)TPPRT
°C
Notes
1.
ESD1 testing is performed in accordance with the Human Body Model (HBM) (C
ZAP= 100pF, RZAP=1500Ω), ESD2 testing is
performed in accordance with the Machine Model (MM) (CZAP=200pF, RZAP=0Ω); and Charge Body Model (CBM)
2.
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
3.