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參數(shù)資料
| 型號(hào)： | MAX16046 |
| 廠商： | Maxim Integrated Products, Inc. |
| 英文描述： | 12-Channel/8-Channel EEPROM-Programmable System Managers with Nonvolatile Fault Registers |
| 中文描述： | 12/8通道EEPROM可編程系統(tǒng)管理器，提供非易失故障寄存器 |
| 文件頁數(shù)： | 54/68頁 |
| 文件大?。?/td> | 570K |
| 代理商： | MAX16046 |
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M
12-Channel/8-Channel EEPROM-Programmable
System Managers with Nonvolatile Fault Registers
54
______________________________________________________________________________________
Shift-DR:
The test data register selected by the current
instruction connects between TDI and TDO and shifts
data one stage toward its serial output on each rising
edge of TCK while TMS is low. On the rising edge of TCK,
the controller goes to the exit1-DR state if TMS is high.
Exit1-DR:
While in this state, a rising edge on TCK puts
the controller in the update-DR state. A rising edge on
TCK with TMS low puts the controller in the pause-DR
state.
Pause-DR:
Shifting of the test data registers halts while
in this state. All test data registers retain their previous
state. The controller remains in this state while TMS is
low. A rising edge on TCK with TMS high puts the con-
troller in the exit2-DR state.
Exit2-DR:
A rising edge on TCK with TMS high while in
this state puts the controller in the update-DR state. A
rising edge on TCK with TMS low enters the shift-DR
state.
Update-DR:
A falling edge on TCK while in the update-
DR state latches the data from the shift register path of
the test data registers into a set of output latches. This
prevents changes at the parallel output because of
changes in the shift register. On the rising edge of TCK,
the controller goes to the run-test/idle state if TMS is
low or goes to the select-DR-scan state if TMS is high.
Select-IR-Scan:
All test data registers retain their previ-
ous states. The instruction register remains unchanged
during this state. With TMS low, a rising edge on TCK
moves the controller into the capture-IR state. TMS high
during a rising edge on TCK puts the controller back
into the test-logic-reset state.
Capture-IR:
Use the capture-IR state to load the shift
register in the instruction register with a fixed value.
This value is loaded on the rising edge of TCK. If TMS
is high on the rising edge of TCK, the controller enters
the exit1-IR state. If TMS is low on the rising edge of
TCK, the controller enters the shift-IR state.
Shift-IR:
In this state, the shift register in the instruction
register connects between TDI and TDO and shifts
data one stage for every rising edge of TCK toward the
TDO serial output while TMS is low. The parallel outputs
of the instruction register as well as all test data regis-
ters remain at their previous states. A rising edge on
TCK with TMS high moves the controller to the exit1-IR
state. A rising edge on TCK with TMS low keeps the
controller in the shift-IR state while moving data one
stage through the instruction shift register.
Exit1-IR:
A rising edge on TCK with TMS low puts the
controller in the pause-IR state. If TMS is high on the
rising edge of TCK, the controller enters the update-IR
state.
Pause-IR:
Shifting of the instruction shift register halts
temporarily. With TMS high, a rising edge on TCK puts
the controller in the exit2-IR state. The controller
remains in the pause-IR state if TMS is low during a ris-
ing edge on TCK.
Exit2-IR:
A rising edge on TCK with TMS high puts the
controller in the update-IR state. The controller loops
back to shift-IR if TMS is low during a rising edge of
TCK in this state.
Update-IR:
The instruction code that has been shifted
into the instruction shift register latches to the parallel
outputs of the instruction register on the falling edge of
TCK as the controller enters this state. Once latched,
this instruction becomes the current instruction. A rising
edge on TCK with TMS low puts the controller in the
run-test/idle state. With TMS high, the controller enters
the select-DR-scan state.
Instruction Register
The instruction register contains a shift register as well
as a latched parallel output and is 5 bits in length. When
the TAP controller enters the shift-IR state, the instruc-
tion shift register connects between TDI and TDO. While
in the shift-IR state, a rising edge on TCK with TMS low
shifts the data one stage toward the serial output at
TDO. A rising edge on TCK in the exit1-IR state or the
exit2-IR state with TMS high moves the controller to the
update-IR state. The falling edge of that same TCK
latches the data in the instruction shift register to the
instruction register parallel output. Instructions support-
ed by the MAX16046/MAX16048 and the respective
operational binary codes are shown in Table 33.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MAX16046ACB+ | 功能描述:監(jiān)控電路 12Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16046ACB+T | 功能描述:監(jiān)控電路 12Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16046ATN+ | 功能描述:監(jiān)控電路 12Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16046ATN+T | 功能描述:監(jiān)控電路 12Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16046ECB+ | 功能描述:監(jiān)控電路 12Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測(cè)電壓數(shù): 監(jiān)測(cè)電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
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