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| 型號(hào)： | KM48S8020B |
| 廠(chǎng)商： | SAMSUNG SEMICONDUCTOR CO. LTD. |
| 英文描述： | 4M x 8Bit x 2 Banks Synchronous DRAM(4M x 8位 x 2組同步動(dòng)態(tài)RAM) |
| 中文描述： | 4米× 8位× 2銀行同步DRAM（4米× 8位× 2組同步動(dòng)態(tài)RAM）的 |
| 文件頁(yè)數(shù)： | 7/43頁(yè) |
| 文件大?。?/td> | 604K |
| 代理商： | KM48S8020B |
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KM48S8020B
CMOS SDRAM
REV .7 July 1998
AC CHARACTERISTICS
(AC operating conditions unless otherwise noted)
Parameter
Symbol
-8
-H
-L
-10
Unit
Note
Min
Max
Min
Max
Min
Max
Min
Max
CLK cycle time
CAS latency=3
t
CC
8
1000
10
1000
10
1000
10
1000
ns
1
CAS latency=2
12
10
12
13
CLK to valid
output delay
CAS latency=3
t
SAC
6
6
6
7
ns
1,2
CAS latency=2
6
6
7
7
Output data
hold time
CAS latency=3
t
OH
3
3
3
3
ns
2
CAS latency=2
3
3
3
3
CLK high pulse width
t
CH
3
3
3
3.5
ns
3
CLK low pulse width
t
CL
3
3
3
3.5
ns
3
Input setup time
t
SS
2
2
2
2.5
ns
3
Input hold time
t
SH
1
1
1
1
ns
3
CLK to output in Low-Z
t
SLZ
1
1
1
1
ns
2
CLK to output
in Hi-Z
CAS latency=3
t
SHZ
6
6
6
7
ns
CAS latency=2
6
6
7
7
1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
If tr & tf is longer than 1ns, transient time compensation should be considered,
i.e., [(tr + tf)/2-1]ns should be added to the parameter.
Notes :
DQ BUFFER OUTPUT DRIVE CHARACTERISTICS
Parameter
Symbol
Condition
Min
Typ
Max
Unit
Notes
Output rise time
trh
Measure in linear
region : 1.2V ~1.8V
1.37
4.37
Volts/ns
4
Output fall time
tfh
Measure in linear
region : 1.2V ~1.8V
1.30
3.8
Volts/ns
4
Output rise time
trh
Measure in linear
region : 1.2V ~1.8V
2.8
3.9
5.6
Volts/ns
1,2,3
Output fall time
tfh
Measure in linear
region : 1.2V ~1.8V
2.0
2.9
5.0
Volts/ns
1,2,3
1. Output rise and fall time must be guaranteed across V
DD
and process range.
2. Rise time specification based on 0pF + 50 Ohms to V
SS
, use these values to design to.
3. Fall time specification based on 0pF + 50 Ohms to V
DD
, use these values to design to.
4. Measured into 50pF only, use these values to characterize to.
5. All measurements done with respect to V
SS
.
Notes :
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