參數(shù)資料
型號(hào)： IDT71V3576S133BQI
廠商： INTEGRATED DEVICE TECHNOLOGY INC
元件分類： SRAM
英文描述： 128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
中文描述： 128K X 36 CACHE SRAM, 4.2 ns, PBGA165
封裝： FBGA-165
文件頁(yè)數(shù)： 13/22頁(yè)
文件大?。?/td> 283K
代理商： IDT71V3576S133BQI
6.42
20
IDT71V3576, IDT71V3578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
3.3V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
NOTES:
1. Device outputs = All device outputs except TDO.
2. Device inputs = All device inputs except TDI, TMS, and
TRST.
Instruction Field
Value
Description
Revision Number (31:28)
0x2
Reserved for version number.
IDT Device ID (27:12)
0x238, 0x23A
Defines IDT part number 71V3576SA and 71V3578SA, respectively.
IDT JEDEC ID (11:1)
0x33
Allows unique identification of device vendor as IDT.
ID Register Indicator Bit (Bit 0)
1
Indicates the presenc e of an ID register.
I5279 tbl 02
JTAG Identification Register Definitions (SA Version only)
Instruction
Description
OPCODE
EXTEST
Forces contents of the bound ary scan cells onto the device outputs(1).
Places the boundary scan registe r (BSR) between TDI and TDO.
0000
SAMPLE/PRELOAD
Places the boundary scan registe r (BSR) between TDI and TDO.
SAMPLE allows data from device inputs(2) and outputs(1) to be captured
in the boundary scan cells and shifted serially through TDO. PRELOAD
allows data to be input serially into the bo undary scan cells via the TDI.
0001
DEVICE_ID
Loads the JTAG ID register (JIDR) with the vendor ID code and places
the register between TDI and TDO.
0010
HIGHZ
Places the bypass register (BYR) be tween TDI and TDO. Forces all
device o utput drivers to a High-Z state.
0011
RESERVED
Several combinations are reserved. Do not use codes other than those
identified for EXTEST, SAMPLE/PRELOAD, DEVICE_ID, HIGHZ, CLAMP,
VALIDATE and BYPASS instructions.
0100
RESERVED
0101
RESERVED
0110
RESERVED
0111
CLAMP
Uses BYR. Forces contents of the bound ary scan cells onto the device
outputs. Places the byp ass registe r (BYR) between TDI and TDO.
1000
RESERVED
Same as above.
1001
RESERVED
1010
RESERVED
1011
RESERVED
1100
VALIDATE
Automatically loaded into the instruction register whenever the TAP
controller passes through the CAPTURE-IR state. The lower two bits '01'
are mand ated by the IEEE std. 1149.1 specification.
1101
RESERVED
Same as above.
1110
BYPASS
The BYPASS instruction is used to truncate the boundary scan register
as a single bit in length.
1111
I5279 tbl 04
Available JTAG Instructions
相關(guān)PDF資料
PDF描述
IDT71V3576S133PFI 128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V3576S150BG 128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V3576S150BGI 128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V3576S133PF 128K x 36, 256K x 18 3.3V Synchronous SRAMs 3.3V I/O, Pipelined Outputs Burst Counter, Single Cycle Deselect
IDT71V67903S80B 512K X 18 CACHE SRAM, 8 ns, PBGA119
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