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參數(shù)資料
| 型號： | GS9035CCPJ |
| 廠商： | Gennum Corporation |
| 英文描述： | GENLINX II -TM GS9035C Serial Digital Reclocker |
| 中文描述： | GENLINX二，商標GS9035C串行數(shù)字時鐘恢復器 |
| 文件頁數(shù)： | 3/14頁 |
| 文件大小： | 490K |
| 代理商： | GS9035CCPJ |
GENNUM CORPORATION
20582 - 3
3 of 14
G
AC ELECTRICAL CHARACTERISTICS
V
CC
= 5.0V, V
EE
= 0V, T
A
= 0°C to 70°C unless otherwise stated, R
LF
= 1.8K, C
LF1
= 15nF, C
LF2
= 3.3pF
PARAMETER
CONDITION
MIN
TYPICAL
1
MAX
UNITS
NOTES
TEST
LEVEL
Serial Data Rate
SDI
143
-
360
Mb/s
3
Intrinsic Jitter
Psuedorandom (2
23
- 1)
270Mb/s
-
185
See Figure 4
ps p-p
2
4
Intrinsic Jitter
(Pathological SDI checkfield)
270Mb/s
-
462
See Figure 5
ps p-p
2
3
360Mb/s
-
308
Input Jitter Tolerance
270Mb/s
0.40
0.50
-
UI
3
9
360Mb/s
0.38
-
-
UI
3
1
Lock Time Synchronous Switch
t
SWITCH
< 0.5μs, 270Mb/s
-
1
-
μs
1,4
8
0.5μs < t
SWITCH
< 10ms
-
1
-
ms
t
SWITCH
> 10ms
-
4
-
ms
Lock Time Asynchronous Switch
Loop Bandwidth = 4.5MHz at
360Mb/s
-
10
-
ms
1,5
8
SDO MUTE Time
0.5
1
2
μs
6
8
SDO to SCO Synchronization
-200
0
200
ps
8
SDO, SCO Output Signal Swing
75
DC load
600
800
1000
mV p-p
1
SDO, SCO Rise and Fall Times
20% - 80%
200
300
400
ps
8
NOTES
1. TYPICAL - measured on EB-RD35A board, T
A
= 25°C.
2. Characterized 6 sigma rms.
3. IJT measured with sinusoidal modulation beyond Loop Bandwidth (at 6.5MHz).
4. Synchronous switching refers to switching the input data from one source to another source which is at the same data rate (ie: line 10
switching for component NTSC).
5. Asynchronous switching refers to switching the input data from one source to another source which is at a different data rate.
6. SDO MUTE Time refers to the response of the SDO output from valid re-clocked input data to mute mode when the input signal is removed.
TEST LEVEL
1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using correlated
test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
9. Indirect test
10.Production test at room temperature.
PATTERN 2
23
-1
CLK DATA
DI
DI
SDO
CH-1 TRIG
TEKTRONIX
GIGABERT 1400
GENNUM
TEST BOARD
TEKTRONIX
CSA803
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