參數(shù)資料
型號: GS8180D09
廠商: GSI TECHNOLOGY
英文描述: 2Mb x 9Bit Separate I/O Sigma DDR SRAM(2M x 9位獨(dú)立I/O接口雙數(shù)據(jù)速率讀和寫模式靜態(tài)ΣRAM)
中文描述: 2MB的x 9Bit分離I / O西格瑪?shù)腄DR SRAM的(2米× 9位獨(dú)立的I / O接口雙數(shù)據(jù)速率讀和寫模式靜態(tài)ΣRAM)
文件頁數(shù): 19/33頁
文件大小: 874K
代理商: GS8180D09
Rev: 1.01 11/2000
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
19/33
2000, Giga Semiconductor, Inc.
A
Advanced Information
GS8180D09/18B-333/300/275/250
AC Test Conditions
Notes:
1.
Test conditions as specified with output loading as shown unless otherwise noted.
AC Test Load Diagrams
Parameter
Conditions
V
DDQ
0 V
2 V/ns
V
DDQ
/2
V
DDQ
/2
Input high level
Input low level
Max. input slew rate
Input reference level
Output reference level
Input and Output Leakage Characteristics
Parameter
Input Leakage Current
(except mode
pins)
Symbol
Test Conditions
Min.
Max
Notes
I
IL
V
IN
= 0 to V
DD
–2 uA
2 uA
Mode Pin Input Current
I
INM
V
DD
V
IN
V
IL
0 V
V
IN
V
IL
Output Disable,
V
OUT
= 0 to V
DDQ
–100 uA
–2 uA
2 uA
2 uA
Output Leakage Current
I
OL
–2 uA
2 uA
Selectable Impedance CMOS Output Driver DC Electrical Characteristics
Parameter
Symbol
V
OHL
V
OLL
V
OHH
V
OLH
Test Conditions
I
OHL
= –4 mA
I
OLL
= 4 mA
I
OHH
= –8 mA
I
OLH
= 8 mA
Min.
Max
Notes
Low Drive Output High Voltage
V
DDQ
– 0.4 V
1
Low Drive Output Low Voltage
0.4 V
1
High Drive Output High Voltage
V
DDQ
– 0.4 V
2
High Drive Output Low Voltage
0.4 V
2
DQ
VT = V
DDQ
/2
50
AC Test Load A
DQ
AC Test Load B
5 pf
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