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REV. 0
–5–
AD9887
Test
Level
AD9887KS
Min
Parameter
Conditions
Typ
Max
Unit
AC SPECIFICATIONS (continued)
High-to-Low Transition Time for DATACK (D
HLT
)
Output Drive = High; C
L
=10 pF
Output Drive = Med; C
L
= 7 pF
Output Drive = Low; C
L
= 5 pF
IV
IV
IV
IV
IV
1.4
1.7
2.1
+2.0
55
ns
ns
ns
ns
% of
Period
High
MHz
MHz
Clock to Data Skew, t
SKEW
Duty Cycle, t
DCYCLE
–0.5
45
DATACK Frequency (F
CIP
) (1 Pixel/Clock)
DATACK Frequency (F
CIP
) (2 Pixels/Clock)
VI
IV
20
10
112
56
NOTES
1
The typical pattern contains a gray scale area, Output Drive = High.
2
The worst-case pattern contains a black and white checkerboard pattern, Output Drive = High.
3
The setup and hold times with respect to the DATACK rising edge are the same as the falling edge.
4
1 Pixel/clock mode, DATACK and
DATACK
Load = 10 pF, Data Load = 5 pF.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD9887 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS
*
V
D
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.6 V
V
DD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.6 V
Analog Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . V
D
to 0.0 V
VREF IN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
D
to 0.0 V
Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 V to 0.0 V
Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
Operating Temperature . . . . . . . . . . . . . . . . . –25
°
C to +85
°
C
Storage Temperature . . . . . . . . . . . . . . . . . . –65
°
C to +150
°
C
Maximum Junction Temperature . . . . . . . . . . . . . . . . 150
°
C
Maximum Case Temperature . . . . . . . . . . . . . . . . . . . 150
°
C
*
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions outside of those indicated in the operation
sections of this specification is not implied. Exposure to absolute maximum ratings
for extended periods may affect device reliability.
EXPLANATION OF TEST LEVELS
Test Level
Explanation
I
II
100% production tested.
100% production tested at 25
°
C and sample
tested at specified temperatures.
Sample tested only.
Parameter is guaranteed by design and charac-
terization testing.
Parameter is a typical value only.
100% production tested at 25
°
C; guaranteed
by design and characterization testing.
III
IV
V
VI
ORDERING GUIDE
Temperature
Range
0
°
C to 70
°
C
0
°
C to 70
°
C
25
°
C
Package
Description
Package
Option
Model
AD9887KS-140
AD9887KS-100
AD9887/PCB
Plastic Quad Flatpack
Plastic Quad Flatpack
Evaluation Board
S-160
S-160