參數(shù)資料
型號: AD7870AJN
廠商: ANALOG DEVICES INC
元件分類: ADC
英文描述: LC2MOS Complete, 12-Bit, 100 kHz , Sampling ADC
中文描述: 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL/PARALLEL ACCESS, PDIP24
封裝: 0.300 INCH, PLASTIC, DIP-24
文件頁數(shù): 4/12頁
文件大?。?/td> 250K
代理商: AD7870AJN
AD7870A
–4–
REV. 0
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7870A features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS*
V
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
SS
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V
AGND to DGND . . . . . . . . . . . . . . . . . –0.3 V to V
DD
+0.3 V
V
IN
to AGND . . . . . . . . . . . . . . . . . . . . . . . . .–15 V to +15 V
REF OUT to AGND . . . . . . . . . . . . . . . . . . . . . . . 0 V to V
DD
Digital Inputs to DGND . . . . . . . . . . . . –0.3 V to V
DD
+0.3 V
Digital Outputs to DGND . . . . . . . . . . . –0.3 V to V
DD
+0.3 V
Operating Temperature Range
Commercial (J Version) . . . . . . . . . . . . . . . . . . . 0
°
C to +70
°
C
ORDERING GUIDE
Relative
Accuracy
(LSB)
Temperature
Range
SNR
(dBs)
Package
Option*
Model
AD7870AJN
0
°
C to +70
°
C
70 min
±
1/2 typ
N-24
*N = Plastic DIP.
Storage Temperature Range . . . . . . . . . . . . –65
°
C to +150
°
C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . .+300
°
C
Power Dissipation (Any Package) to +75
°
C . . . . . . . 450 mW
Derates above +75
°
C by . . . . . . . . . . . . . . . . . . . . 10 mW/
°
C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only; functional operation
of the device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
PIN CONFIGURATION
DIP
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