參數(shù)資料
型號(hào): TLE2074AMFK
廠商: Texas Instruments, Inc.
英文描述: EXCALIBUR LOW-NOISE HIGH-SPEED JFET-INPUT OPERATIONAL AMPLIFIERS
中文描述: 神劍低噪聲高速JFET輸入運(yùn)算放大器
文件頁數(shù): 49/77頁
文件大?。?/td> 1274K
代理商: TLE2074AMFK
TLE207x, TLE207xA, TLE207xY
EXCALIBUR LOW-NOISE HIGH-SPEED
JFET-INPUT OPERATIONAL AMPLIFIERS
SLOS181A – FEBRUARY 1997 – REVISED MARCH 2000
49
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
+
+
2 k
VCC+
VCC+
VO
VO
VCC–
VCC–
RS
RS
Ground Shield
Picoammeters
Figure 3. Noise-Voltage Test Circuit
Figure 4. Input-Bias and Offset-
Current Test Circuit
+
VCC+
VO
VCC–
IN–
IN+
Cic
Cic
Cid
Figure 5. Internal Input Capacitance
typical values
Typical values presented in this data sheet represent the median (50% point) of device parametric performance.
input bias and offset current
At the picoampere bias current level typical of the TLE207x and TLE207xA, accurate measurement of the bias
current becomes difficult. Not only does this measurement require a picoammeter but test socket leakages can
easily exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments
uses a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but
with no device in the socket. The device is then inserted in the socket and a second test is performed that
measures both the socket leakage and the device input bias current. The two measurements are then
subtracted algebraically to determine the bias current of the device.
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