參數(shù)資料
型號(hào): STM32F102R4T6ATR
廠商: STMICROELECTRONICS
元件分類: 微控制器/微處理器
英文描述: RISC MICROCONTROLLER, PQFP64
封裝: 10 X 10 MM, ROHS COMPLIANT, LQFP-64
文件頁數(shù): 57/69頁
文件大小: 809K
代理商: STM32F102R4T6ATR
Electrical characteristics
STM32F102x4, STM32F102x6
Figure 26.
ADC accuracy characteristics
Figure 27.
Typical connection diagram using the ADC
1.
Refer to Table 44 for the values of RAIN, RADC and CADC.
2.
Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
pad capacitance (roughly 7 pF). A high Cparasitic value will downgrade conversion accuracy. To remedy
this, fADC should be reduced.
EO
EG
1LSBIDEAL
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset Error: deviation between the first actual
transition and the first ideal one.
EG=Gain Error: deviation between the last ideal
transition and the last actual one.
ED=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
EL=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
4095
4094
4093
5
4
3
2
1
0
7
6
1
2
3
456
7
4093 4094 4095 4096
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
ai14395b
VREF+
4096
(or
depending on package)]
VDDA
4096
[1LSBIDEAL =
ai14974b
STM32F102
VDD
AINx
IL±1 A
0.6 V
VT
RAIN(1)
Cparasitic
VAIN
0.6 V
VT
RADC(1)
12-bit
converter
CADC(1)
Sample and hold ADC
converter
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