- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄193535 > SNJ54BCT8244AFKR (TEXAS INSTRUMENTS INC) BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CQCC28 PDF資料下載
參數(shù)資料
| 型號： | SNJ54BCT8244AFKR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CQCC28 |
| 封裝： | CERAMIC, LCC-28 |
| 文件頁數(shù)： | 24/29頁 |
| 文件大?。?/td> | 618K |
| 代理商： | SNJ54BCT8244AFKR |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁當(dāng)前第24頁第25頁第26頁第27頁第28頁第29頁
SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E FEBRUARY 1990 REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
Terminal Functions
TERMINAL NAME
DESCRIPTION
1A11A4, 2A12A4
Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs high if left
unconnected.
GND
Ground
1OE, 2OE
Normal-function output-enable inputs. See function table for normal-mode logic. Internal pullups force these inputs
high if left unconnected.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are
synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An
internal pullup forces TCK to a high level if left unconnected.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting
data through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is
not active and is not driven from an external source.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its
TAP controller states. An internal pullup forces TMS to a high level if left unconnected. TMS also provides the optional
test reset signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double high
(VIHH), at TMS.
VCC
Supply voltage
1Y11Y4, 2Y12Y4
Normal-function data outputs. See function table for normal-mode logic.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SNJ54LS28J | LS SERIES, QUAD 2-INPUT NOR GATE, CDIP14 |
| SNP-58803101 | 900 um, SINGLE MODE, SIMPLEX FC CONNECTOR |
| SNP-88012500301 | 125 um, SINGLE MODE, SIMPLEX FC CONNECTOR, PLUG |
| SNP-880125083J1 | 125 um, SINGLE MODE, SIMPLEX FC CONNECTOR, PLUG |
| SNP-8801250B301 | 125 um, SINGLE MODE, SIMPLEX FC CONNECTOR, PLUG |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SNJ54BCT8244AJT | 制造商:Texas Instruments 功能描述:Scan Buffer/Line Driver 8-CH Non-Inverting 3-ST BiCMOS 24-Pin CDIP Tube |
| SNJ54BCT8245AFK | 制造商:Texas Instruments 功能描述: 制造商:Texas Instruments 功能描述:Bus XCVR Single 8-CH 3-ST 28-Pin LCCC Tube |
| SNJ54BCT8245AJT | 制造商:Texas Instruments 功能描述: 制造商:Texas Instruments 功能描述:Bus XCVR Single 8-CH 3-ST 24-Pin CDIP Tube |
| SNJ54BCT8373AFK | 制造商:Texas Instruments 功能描述: |
| SNJ54BCT8374AJT | 制造商:Texas Instruments 功能描述:Flip Flop D-Type Bus Interface Pos-Edge 3-ST 1-Element 24-Pin CDIP Tube |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。