參數(shù)資料
型號(hào)： SN54LVTH182502A
廠商： Texas Instruments, Inc.
英文描述： 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(18位通用總線收發(fā)器))
中文描述： 的3.3V ABT生根粉掃描測試設(shè)備與18位通用總線收發(fā)器（3.3VABT掃描測試裝置（18位通用總線收發(fā)器））
文件頁數(shù)： 27/35頁
文件大?。?/td> 806K
代理商： SN54LVTH182502A
SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS668A – JULY 1996 – REVISED DECEMBER 1996
27
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH18502A
MIN
TYP
SN74LVTH18502A
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 2.7 V,
VCC = MIN to MAX,
VCC = 2.7 V,
II = –18 mA
IOH = –100
μ
A
IOH = –3 mA
IOH = –8 mA
IOH = –24 mA
IOH = –32 mA
IOL = 100
μ
A
IOL = 24 mA
IOL = 16 mA
IOL = 32 mA
IOL = 48 mA
IOL = 64 mA
VI = VCC or GND
VI = 5.5 V
VI = 5.5 V
VI = VCC
VI = 0
VI = 5.5 V
VI = VCC
VI = 0
VI or VO = 0 to
4.5 V
VI = 0.8 V
VI = 2 V
VO = 3 V
VO = 0.5 V
VO = 0.5 V or 3 V
VO = 0.5 V or 3 V
Outputs high
–1.2
–1.2
V
VOH
VCC–0.2
VCC–0.2
V
2.4
2.4
VCC = 3 V
2.4
2.4
2
2
VOL
VCC= 2 7 V
VCC = 2.7 V
0.2
0.2
V
0.5
0.5
VCC= 3 V
VCC = 3 V
0.4
0.4
0.5
0.5
0.55
0.55
±
1
10
II
CLK,
LE, TCK
VCC = 3.6 V,
VCC = 0 or MAX,
±
1
10
OE TDI
OE, TDI,
TMS
VCC = 3.6 V
3 6 V
5
5
1
1
μ
A
–25
–100
–25
–100
A or B
ports§
VCC = 3.6 V
3 6 V
20
20
1
1
–5
–5
Ioff
VCC = 0,
±
100
500
μ
A
II(h ld)
A or B
ports
VCC= 3 V
VCC = 3 V
75
500
75
150
μ
A
II(hold)
–75
–500
–75
–150
–500
IOZH
IOZL
IOZPU
IOZPD
TDO
VCC = 3.6 V,
VCC = 3.6 V,
VCC = 0 to 1.5 V,
VCC = 1.5 V to 0,
1
1
μ
A
μ
A
μ
A
μ
A
TDO
–1
±
50
±
50
–1
±
50
±
50
TDO
TDO
ICC
VCC = 3.6 V,
IO
VI = VCC or GND
0.6
2
0.6
2
Outputs low
18
24
18
24
mA
Outputs disabled
0.6
2
0.6
2
ICC#
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
0.5
0.5
mA
Ci
Cio
Co
4
4
pF
10
10
pF
8
8
pF
All typical values are at VCC = 3.3 V, TA = 25
°
C.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
§Unused pins at VCC or GND
The parameter II(hold) includes the off-state output leakage current.
#This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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