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參數(shù)資料
| 型號： | SN54ABT182502A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| 中文描述： | 掃描測試設(shè)備與18位通用總線收發(fā)器（掃描測試裝置（帶18位通用總線收發(fā)器）） |
| 文件頁數(shù)： | 9/35頁 |
| 文件大?。?/td> | 738K |
| 代理商： | SN54ABT182502A |
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SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
register overview
With the exception of the bypass and device identification registers, any test register can be thought of as a serial
shift register with a shadow latch on each bit. The bypass and device identification registers differ in that they
contain only a shift register. During the appropriate capture state (Capture-IR for instruction register,
Capture-DR for data registers), the shift register can be parallel loaded from a source specified by the current
instruction. During the appropriate shift state (Shift-IR or Shift-DR), the contents of the shift register are shifted
out from TDO while new contents are shifted in at TDI. During the appropriate update state (Update-IR or
Update-DR), the shadow latches are updated from the shift register.
instruction register description
The instruction register (IR) is eight bits long and tells the device what instruction is to be executed. Information
contained in the instruction includes the mode of operation (either normal mode, in which the device performs
its normal logic function, or test mode, in which the normal logic function is inhibited or altered), the test operation
to be performed, which of the four data registers is to be selected for inclusion in the scan path during data
register scans, and the source of data to be captured into the selected data register during Capture-DR.
Table 3 lists the instructions supported by the
′
ABT18502A and
′
ABT182502A. The even-parity feature specified
for SCOPE
devices is supported in this device. Bit 7 of the instruction opcode is the parity bit. Any instructions
that are defined for SCOPE
devices but are not supported by this device default to BYPASS.
During Capture-IR, the IR captures the binary value 10000001. As an instruction is shifted in, this value is shifted
out via TDO and can be inspected as verification that the IR is in the scan path. During Update-IR, the value
that has been shifted into the IR is loaded into shadow latches. At this time, the current instruction is updated
and any specified mode change takes effect. At power up or in the Test-Logic-Reset state, the IR is reset to the
binary value 10000001, which selects the IDCODE instruction.
The IR order of scan is illustrated in Figure 2.
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
TDO
TDI
Bit 7
Parity
(MSB)
Bit 0
(LSB)
Figure 2. Instruction Register Order of Scan
P
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PDF描述 |
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| SN54ABT18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN74AHC16245 | 16-Bit Bus Transceivers With 3-State Outputs(16位緩沖器/驅(qū)動器(三態(tài)輸出)) |
| SN74AHC240DBRG4 | OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT18502 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18502HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18504 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
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