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參數資料
| 型號： | SN54ABT182502A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| 中文描述： | 掃描測試設備與18位通用總線收發(fā)器（掃描測試裝置（帶18位通用總線收發(fā)器）） |
| 文件頁數： | 3/35頁 |
| 文件大?。?/td> | 738K |
| 代理商： | SN54ABT182502A |
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SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data
output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin
architecture. This architecture is implemented to capture test data of most interest. A PSA/COUNT instruction
also is included to ease the testing of memories and other circuits where a binary count addressing scheme is
useful.
The B-port outputs of
′
ABT182502A, which are designed to source or sink up to 12 mA, include 25-
series
resistors to reduce overshoot and undershoot.
The SN54ABT18502A and SN54ABT182502A are characterized for operation over the full military temperature
range of –55
°
C to 125
°
C. The SN74ABT18502A and SN74ABT182502A are characterized for operation from
–40
°
C to 85
°
C.
FUNCTION TABLE
(normal mode, each register)
INPUTS
OUTPUT
B
B0
L
OEAB
L
LEAB
L
CLKAB
L
↑
↑
X
A
X
L
L
L
L
L
H
H
L
H
L
L
L
H
X
H
H
H
X
X
X
Z
A-to-B data flow is shown. B-to-A data flow is similar
but uses OEBA, LEBA, and CLKBA.
Output level before the indicated steady-state input
conditions were established.
P
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PDF描述 |
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| SN54ABT18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| SN74AHC16245 | 16-Bit Bus Transceivers With 3-State Outputs(16位緩沖器/驅動器(三態(tài)輸出)) |
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相關代理商/技術參數 |
參數描述 |
|---|---|
| SN54ABT18502 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18502HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18504 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
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