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參數(shù)資料
| 型號： | SN54ABT182502A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器)) |
| 中文描述： | 掃描測試設(shè)備與18位通用總線收發(fā)器（掃描測試裝置（帶18位通用總線收發(fā)器）） |
| 文件頁數(shù)： | 32/35頁 |
| 文件大小： | 738K |
| 代理商： | SN54ABT182502A |
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SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
32
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted) (continued)
PARAMETER
TEST CONDITIONS
TA = 25
°
C
TYP
SN54ABT182502A
MIN
SN74ABT182502A
MIN
UNIT
MIN
MAX
MAX
MAX
Ci
Control
inputs
VI = 2.5 V or 0.5 V
5
pF
Cio
Co
* On products compliant to MIL-STD-883, Class B, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
A or B ports
VO = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
10
pF
TDO
8
pF
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 14)
12
SN54ABT182502A
MIN
SN74ABT182502A
MIN
UNIT
MAX
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
0
100
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
3.5
ns
LEAB or LEBA high
A before CLKAB
↑
or B before CLKBA
↑
3.5
Setup time
3.5
tsu
A before LEAB
↓
or B before LEBA
↓
CLK high
3.5
ns
CLK low
2
th
Hold time
A after CLKAB
↑
or B after CLKBA
↑
A after LEAB
↓
or B after LEBA
↓
0.5
ns
3
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 14)
SN54ABT182502A
MIN
SN74ABT182502A
MIN
UNIT
MAX
MAX
fclock
tw
Clock frequency
TCK
0
50
0
50
MHz
Pulse duration
TCK high or low
A, B, CLK, LE, or OE before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, LE, or OE after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
8
ns
Setup time
6
tsu
4.5
ns
3
H ld i
Hold time
1.5
th
1
ns
1.5
td
tr
Delay time
50
ns
μ
s
Rise time
1
P
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT18502 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18502HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| SN54ABT18504 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
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