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參數(shù)資料
| 型號： | SAB-C505-LM |
| 廠商： | SIEMENS A G |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 8-Bit CMOS Microcontroller |
| 中文描述： | 8-BIT, MROM, 20 MHz, MICROCONTROLLER, PQFP44 |
| 封裝： | PLASTIC, MQFP-44 |
| 文件頁數(shù)： | 69/85頁 |
| 文件大小： | 487K |
| 代理商： | SAB-C505-LM |
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C505L
Data Sheet
67
06.99
Notes:
1)
V
AIN
may exceed
V
AGND
or
V
AREF
up to the absolute maximum ratings. However, the conversion result in these
cases will be X000
H
or X3FF
H
, respectively.
2) During the sample time the input capacitance
C
AIN
must be charged/discharged by the external source. The
internal resistance of the analog source must allow the capacitance to reach their final voltage level within
t
S
.
After the end of the sample time
t
S
, changes of the analog input voltage have no effect on the conversion result.
3) This parameter includes the sample time
t
S
, the time for determining the digital result and the time for the
calibration. Values for the conversion clock
t
ADC
depend on programming and can be taken from the table on
the previous page.
4)
T
UE
is tested at
V
AREF
= 5.0 V,
V
AGND
= 0 V,
V
DD
= 4.9 V. It is guaranteed by design characterization for all other
voltages within the defined voltage range.
If an overload condition occurs on maximum 2 unused analog input pins and the absolute sum of input
overload currents on all analog input pins does not exceed 10 mA, an additional conversion error of 1/2 LSB
is permissible.
5) During the conversion the ADC’s capacitance must be repeatedly charged or discharged. The internal
resistance of the reference source must allow the capacitance to reach their final voltage level within the
indicated time. The maximum internal resistance results from the programmed conversion timing.
6) Not 100% tested, but guaranteed by design characterization.
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