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參數(shù)資料
| 型號： | DS26504LNB2+ |
| 廠商： | Maxim Integrated Products |
| 文件頁數(shù)： | 10/129頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC T1/E1/J1 64KCC ELEMENT 64LQFP |
| 產(chǎn)品培訓(xùn)模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標(biāo)準(zhǔn)包裝： | 160 |
| 功能： | BITS 元件 |
| 接口： | 64KCC，E1，T1 |
| 電路數(shù)： | 1 |
| 電源電壓： | 3.14 V ~ 3.47 V |
| 電流 - 電源： | 150mA |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 64-LQFP |
| 供應(yīng)商設(shè)備封裝： | 64-LQFP（10x10） |
| 包裝： | 管件 |
| 包括： | * |
| 其它名稱： | 90-26504+NB2 |
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DS26504 T1/E1/J1/64KCC BITS Element
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17.1 Instruction Register
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length.
When the TAP controller enters the Shift-IR state, the instruction shift register is connected between
JTDI and JTDO. While in the Shift-IR state, a rising edge on JTCLK with JTMS LOW shifts the data one
stage toward the serial output at JTDO. A rising edge on JTCLK in the Exit1-IR state or the Exit2-IR
state with JTMS HIGH moves the controller to the Update-IR state. The falling edge of that same JTCLK
will latch the data in the instruction shift register to the instruction parallel output.
Table 17-1. Instruction Codes for IEEE 1149.1 Architecture
INSTRUCTION
SELECTED REGISTER
INSTRUCTION CODES
SAMPLE/PRELOAD
Boundary Scan
010
BYPASS
Bypass
111
EXTEST
Boundary Scan
000
CLAMP
Bypass
011
HIGHZ
Bypass
100
IDCODE
Device Identification
001
SAMPLE/PRELOAD
This is a mandatory instruction for the IEEE 1149.1 specification that supports two functions. The digital
I/Os of the device can be sampled at the boundary scan register without interfering with the normal
operation of the device by using the Capture-DR state. SAMPLE/PRELOAD also allows the device to
shift data into the boundary scan register via JTDI using the Shift-DR state.
BYPASS
When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO
through the one-bit bypass test register. This allows data to pass from JTDI to JTDO not affecting the
device’s normal operation.
EXTEST
This allows testing of all interconnections to the device. When the EXTEST instruction is latched in the
instruction register, the following actions occur. Once enabled via the Update-IR state, the parallel
outputs of all digital output pins are driven. The boundary scan register is connected between JTDI and
JTDO. The Capture-DR samples all digital inputs into the boundary scan register.
CLAMP
All digital outputs of the device will output data from the boundary scan parallel output while connecting
the bypass register between JTDI and JTDO. The outputs will not change during the CLAMP instruction.
HIGHZ
All digital outputs of the device will be placed in a high-impedance state. The BYPASS register is
connected between JTDI and JTDO.
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| DS26504LNB2+ | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC E1/T1/J1/64Kcc Bits Element RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS26514 | 制造商:MAXIM 制造商全稱:Maxim Integrated Products 功能描述:4-Port T1/E1/J1 Transceiver Fully Internal Impedance Match, No External Resistor |
| DS26514_11 | 制造商:MAXIM 制造商全稱:Maxim Integrated Products 功能描述:4-Port T1/E1/J1 Transceiver Fully Internal Impedance Match, No External Resistor |
| DS26514DK | 功能描述:網(wǎng)絡(luò)開發(fā)工具 DS26514 Dev Kit RoHS:否 制造商:Rabbit Semiconductor 產(chǎn)品:Development Kits 類型:Ethernet to Wi-Fi Bridges 工具用于評估:RCM6600W 數(shù)據(jù)速率:20 Mbps, 40 Mbps 接口類型:802.11 b/g, Ethernet 工作電源電壓:3.3 V |
| DS26514G | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
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