參數(shù)資料
型號(hào): AD7835BS
廠商: ANALOG DEVICES INC
元件分類: DAC
英文描述: LC2MOS Quad 14-Bit DAC
中文描述: QUAD, SERIAL INPUT LOADING, 14-BIT DAC, PQFP44
封裝: PLASTIC, QFP-44
文件頁(yè)數(shù): 6/16頁(yè)
文件大小: 404K
代理商: AD7835BS
REV. A
–6–
AD7834/AD7835
AD7835 PIN DESCRIPTION
Pin Mnemonic
Description
V
CC
V
SS
V
DD
DGND
AGND
V
REF
(+)A, V
REF
(–)A
V
REF
(+)B, V
REF
(–)B
V
OUT
1 . . . V
OUT
4
CS
DB0 . . . DB13
Logic Power Supply; +5 V
±
5%.
Negative Analog Power Supply; –15 V
±
5%.
Positive Analog Power Supply; +15 V
±
5%.
Digital Ground.
Analog Ground.
Reference Inputs for DACs 1 and 2. These reference voltages are referred to AGND.
Reference Inputs for DACs 3 and 4. These reference voltages are referred to AGND.
DAC Outputs.
Level-Triggered Chip Select Input (active low). The device is selected when this input is low.
Parallel Data Inputs. The AD7835 can accept a straight 14-bit parallel word on DB0 to DB13, where
DB13 is the MSB and the
BYSHF
input is hardwired to a logic high. Alternatively for byte loading, the
bottom 8 data inputs, DB0–DB7, are used for data loading while the top 6 data inputs, DB8 to DB13,
should be hardwired to a logic low. The
BYSHF
control input selects whether 8 LSBs or 6 MSBs of data
are being loaded into the device.
Byte Shift Input. When low, it shifts the data on DB0–DB7 into the DB8–DB13 half of the input register.
Address inputs. A0 and A1 are decoded to select one of the four input latches for a data transfer. A2 is
used to select all four DACs simultaneously.
Load DAC Input (level sensitive). This input signal in conjunction with the
WR
and
CS
input signals, de-
termines how the analog outputs are updated. If
LDAC
is maintained high while new data is being loaded
into the device’s input registers, no change occurs on the analog outputs. Subsequently, when
LDAC
is
brought low, the contents of all four input registers are transferred into their respective DAC latches, up-
dating the analog outputs simultaneously.
Alternatively, if
LDAC
is brought low while new data is being entered, then the addressed DAC latch
(and corresponding analog output) is updated immediately on the rising edge of
WR
.
Asynchronous Clear Input (level sensitive, active low). When this input is brought low, all analog outputs
are switched to the externally set potentials on the DSG pins (V
OUT
1 and V
OUT
2 follow DSGA while
V
OUT
3 and V
OUT
4 follow DSGB). When
CLR
is brought high, the signal outputs remain at the DSG po-
tentials until
LDAC
is brought low. When
LDAC
is brought low, the analog outputs are switched back to
reflect their individual DAC output levels. As long as
CLR
remains low, the
LDAC
signals are ignored
and the signal outputs remain switched to the potential on the DSG pins.
Level-Triggered Write Input (active low). When active it is used in conjunction with
CS
to write data over
the input data bus.
Device Sense Ground A Input. Used in conjunction with the
CLR
input for power-on protection of the
DACs. When
CLR
is low, DAC outputs V
OUT
1 and V
OUT
2 are forced to the potential on the DSGA pin.
Device Sense Ground B Input. Used in conjunction with the
CLR
input for power-on protection of the
DACs. When
CLR
is low, DAC outputs V
OUT
3 and V
OUT
4 are forced to the potential on the DSGB pin.
BYSHF
A0, A1, A2
LDAC
CLR
WR
DSGA
DSGB
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