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參數(shù)資料
| 型號： | A1460A-CQ196E |
| 元件分類： | FPGA |
| 英文描述： | FPGA, 848 CLBS, 6000 GATES, 85 MHz, CQFP196 |
| 封裝： | CAVITY-UP, CERAMIC, QFP-196 |
| 文件頁數(shù)： | 89/98頁 |
| 文件大?。?/td> | 2005K |
| 代理商： | A1460A-CQ196E |
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9
Hi R e l F P GA s
Ac t e l Ex t end ed Fl ow 1
Notes:
1.
Actel offers the extended flow for customers who require additional screening beyond the requirements of the MIL-STD-833, Class B. Actel is
compliant to the requirements of MIL-STD-883, Paragraph 1.2.1, and MIL-I-38535, Appendix A. Actel is offering this extended flow
incorporating the majority of the screening procedures as outlined in Method 5004 of MIL-STD-883, Class S. The exceptions to Method 5004
are shown in notes 2 and 3 below.
2.
Wafer lot acceptance is performed to Method 5007; however, the step coverage requirement as specified in Method 2018 must be waived.
3.
MIL-STD-883, Method 5004 requires 100 percent Radiation latch-up testing (Method 1020). Actel will not be performing any radiation testing,
and this requirement must be waived in its entirety.
Step
Screen
Method
Require-
ment
1.
Wafer Lot Acceptance2
5007 with Step Coverage Waiver
All Lots
2.
Destructive In-Line Bond Pull3
2011, Condition D
Sample
3.
Internal Visual
2010, Condition A
100%
4.
Serialization
100%
5.
Temperature Cycling
1010, Condition C
100%
6.
Constant Acceleration
2001, Condition D or E, Y1 Orientation Only
100%
7.
Particle Impact Noise Detection
2020, Condition A
100%
8.
Radiographic
2012 (one view only)
100%
9.
Pre-Burn-In Test
In accordance with applicable Actel device specification
100%
10.
Burn-in Test
1015, Condition D, 240 hours @ 125°C minimum
100%
11.
Interim (Post-Burn-In) Electrical Parameters
In accordance with applicable Actel device specification
100%
12.
Reverse Bias Burn-In
1015, Condition C, 72 hours @ 150°C minimum
100%
13.
Interim (Post-Burn-In) Electrical Parameters
In accordance with applicable Actel device specification
100%
14.
Percent Defective Allowable (PDA)
Calculation
5%, 3% Functional Parameters @ 25°C
All Lots
15.
Final Electrical Test
a. Static Tests
(1) 25°C
(Subgroup 1, Table1)
(2) –55°C and +125°C
(Subgroups 2, 3, Table 1)
b. Functional Tests
(1) 25°C
(Subgroup 7, Table 15)
(2) –55°C and +125°C
(Subgroups 8A and B, Table 1)
c. Switching Tests at 25°C
(Subgroup 9, Table 1)
In accordance with Actel applicable device specification
which includes a, b, and c:
5005
100%
16.
Seal
a. Fine
b. Gross
1014
100%
17.
External Visual
2009
100%
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| A1460A-CQ196M | 制造商:Microsemi Corporation 功能描述:FPGA ACT 3 Family 6K Gates 848 Cells 100MHz 0.8um Technology 5V 196-Pin CQFP 制造商:Microsemi Corporation 功能描述:FPGA ACT 3 6K GATES 848 CELLS 100MHZ 0.8UM 5V 196CQFP - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 6K GATES 196-CQFP MIL |
| A1460A-PG207B | 功能描述:IC FPGA 6K GATES 207-CPGA MIL RoHS:否 類別:集成電路 (IC) >> 嵌入式 - FPGA（現(xiàn)場可編程門陣列） 系列:ACT™ 3 標(biāo)準(zhǔn)包裝:1 系列:ProASICPLUS LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):129024 輸入/輸出數(shù):248 門數(shù):600000 電源電壓:2.3 V ~ 2.7 V 安裝類型:表面貼裝 工作溫度:- 封裝/外殼:352-BFCQFP，帶拉桿 供應(yīng)商設(shè)備封裝:352-CQFP（75x75） |
| A1460A-PG207C | 功能描述:IC FPGA 6K GATES 207-CPGA RoHS:否 類別:集成電路 (IC) >> 嵌入式 - FPGA（現(xiàn)場可編程門陣列） 系列:ACT™ 3 標(biāo)準(zhǔn)包裝:1 系列:ProASICPLUS LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):129024 輸入/輸出數(shù):248 門數(shù):600000 電源電壓:2.3 V ~ 2.7 V 安裝類型:表面貼裝 工作溫度:- 封裝/外殼:352-BFCQFP，帶拉桿 供應(yīng)商設(shè)備封裝:352-CQFP（75x75） |
| A1460A-PG207M | 制造商:Microsemi Corporation 功能描述:FPGA ACT 3 6K GATES 848 CELLS 100MHZ 0.8UM 5V 207CPGA - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 6K GATES 207-CPGA MIL |
| A1460A-PQ160C | 功能描述:IC FPGA 6K GATES 160-PQFP RoHS:否 類別:集成電路 (IC) >> 嵌入式 - FPGA（現(xiàn)場可編程門陣列） 系列:ACT™ 3 標(biāo)準(zhǔn)包裝:1 系列:ProASICPLUS LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):129024 輸入/輸出數(shù):248 門數(shù):600000 電源電壓:2.3 V ~ 2.7 V 安裝類型:表面貼裝 工作溫度:- 封裝/外殼:352-BFCQFP，帶拉桿 供應(yīng)商設(shè)備封裝:352-CQFP（75x75） |
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