參數資料
型號: XCV405E-8BG560C
廠商: Xilinx Inc
文件頁數: 89/118頁
文件大小: 0K
描述: IC FPGA 1.8V C-TEMP 560-MBGA
產品變化通告: FPGA Family Discontinuation 18/Apr/2011
標準包裝: 1
系列: Virtex®-E EM
LAB/CLB數: 2400
邏輯元件/單元數: 10800
RAM 位總計: 573440
輸入/輸出數: 404
門數: 129600
電源電壓: 1.71 V ~ 1.89 V
安裝類型: 表面貼裝
工作溫度: 0°C ~ 85°C
封裝/外殼: 560-LBGA,金屬
供應商設備封裝: 560-MBGA(42.5x42.5)
Virtex-E 1.8 V Extended Memory Field Programmable Gate Arrays
Module 3 of 4
DS025-3 (v3.0) March 21, 2014
16
R
— OBSOLETE — OBSOLETE — OBSOLETE — OBSOLETE —
Virtex-E Pin-to-Pin Output Parameter Guidelines
All devices are 100% functionally tested. Listed below are representative values for typical pin locations and normal clock
loading. Values are expressed in nanoseconds unless otherwise noted.
Global Clock Input to Output Delay for LVTTL, 12 mA, Fast Slew Rate, with DLL
Global Clock Input to Output Delay for LVTTL, 12 mA, Fast Slew Rate, without DLL
Description(1)
Symbol
Device(3)
Speed Grade(2)
Units
Min
-8
-7
-6
LVTTL Global Clock Input to Output Delay using
Output Flip-flop, 12 mA, Fast Slew Rate, with
DLL.
For data output with different standards, adjust
the delays with the values shown in ‘‘IOB Output
TICKOFDLL
XCV405E
1.0
3.1
ns
XCV812E
1.0
3.1
ns
Notes:
1.
Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and
where all accessible IOB and CLB flip-flops are clocked by the global clock net.
2.
Output timing is measured at 50% VCC threshold with 35 pF external capacitive load. For other I/O standards and different loads, see
3.
DLL output jitter is already included in the timing calculation.
Description(1)
Symbol
Device
Speed Grade(2)
Units
Min
-8
-7
-6
LVTTL Global Clock Input to Output Delay using
Output Flip-flop, 12 mA, Fast Slew Rate, without
DLL.
For data output with different standards, adjust
the delays with the values shown in ‘‘IOB Output
TICKOF
XCV405E
1.6
4.5
4.7
4.9
ns
XCV812E
1.8
4.8
5.0
5.2
ns
Notes:
1.
Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and
where all accessible IOB and CLB flip-flops are clocked by the global clock net.
2.
Output timing is measured at 50% VCC threshold with 35 pF external capacitive load. For other I/O standards and different loads, see
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