參數(shù)資料
型號(hào): XCR3128A-10TQ128I
廠商: XILINX INC
元件分類: PLD
英文描述: CPLD with Enhanced Clocking
中文描述: EE PLD, 10 ns, PQFP128
封裝: PLASTIC, TQFP-128
文件頁(yè)數(shù): 7/17頁(yè)
文件大?。?/td> 268K
代理商: XCR3128A-10TQ128I
R
XCR3128A: 128 Macrocell CPLD with Enhanced Clocking
7
www.xilinx.com
1-800-255-7778
DS035 (v1.2) August 10, 2000
JTAG Testing Capability
JTAG
Boundary-scan Test (BST) feature defined for integrated
circuits by IEEE Standard 1149.1. This standard defines
input/output pins, logic control functions, and commands
which facilitate both board and device level testing without
the use of specialized test equipment. The Xilinx
XCR3128A devices use the JTAG Interface for In-System
Programming/Reprogramming. Although only a subset of
the full JTAG command set is implemented (see
),
is
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