參數(shù)資料
型號(hào)： WF512K32-120G4TC5
廠商： WHITE ELECTRONIC DESIGNS CORP
元件分類： PROM
英文描述： 512K X 32 FLASH 5V PROM MODULE, 120 ns, CQFP68
封裝： 40 MM, 3.50 MM HEIGHT, CERAMIC, QFP-68
文件頁(yè)數(shù)： 11/16頁(yè)
文件大?。?/td> 566K
代理商： WF512K32-120G4TC5
4
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
WF512K32-XXX5
March 2006
Rev. 11
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS# CONTROLLED
VCC = 5.0V, GND = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Symbol
-60
-70
-90
-120
-150
Unit
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tAVAV
tWC
60
70
90
120
150
ns
Write Enable Setup Time
tWLEL
tWS
00000
ns
Chip Select Pulse Width
tELEH
tCP
40
45
50
ns
Address Setup Time
tAVEL
tAS
00000
ns
Data Setup Time
tDVEH
tDS
40
45
50
ns
Data Hold Time
tEHDX
tDH
00000
ns
Address Hold Time
tELAX
tAH
40
45
50
ns
Chip Select Pulse Width High
tEHEL
tCPH
20
ns
Duration of Byte Programming Operation (1)
tWHWH1
300
μs
Sector Erase Time (2)
tWHWH2
15
sec
Read Recovery Time
tGHEL
00000
ns
Chip Programming Time
11
sec
Chip Erase Time (3)
64
sec
NOTES:
1. Typical value for tWHWH1 is 7μs.
2. Typical value for tWHWH2 is 1sec.
3. Typical value for Chip Erase Time is 8sec.
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
1.5V
(Bipolar Supply)
Z
Current Source
OH
FIGURE. 4 – AC TEST CIRCUIT
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC Test Conditions
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
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